• 744 Citations
  • 14 h-Index
1992 …2020

Research output per year

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Research Output

  • 744 Citations
  • 14 h-Index
  • 106 Article
  • 6 Conference contribution
  • 2 Conference article
  • 1 Paper
Open Access
  • Change of characteristics of n-GaN MOS capacitors with Hf-rich HfSiOx gate dielectrics by post-deposition annealing

    Maeda, E., Nabatame, T., Yuge, K., Hirose, M., Inoue, M., Ohi, A., Ikeda, N., Shiozaki, K. & Kiyono, H., 2019 Aug 15, In : Microelectronic Engineering. 216, 111036.

    Research output: Contribution to journalArticle

  • 2 Citations (Scopus)

    Characteristics of several high-k gate insulators for GaN power device

    Nabatame, T., Maeda, E., Inoue, M., Hirose, M., Kiyono, H., Irokawa, Y., Shiozaki, K. & Koide, Y., 2019 Jan 1, Semiconductor Process Integration 11. Murota, J., Claeys, C., Iwai, H., Tao, M., Deleonibus, S., Mai, A., Shiojima, K. & Cao, Y. (eds.). 4 ed. Electrochemical Society Inc., p. 109-117 9 p. (ECS Transactions; vol. 92, no. 4).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • 2 Citations (Scopus)

    Influence of ammonia gas exposure on microstructure of nanocrystalline titanium nitride powder synthesized from titanium dioxide

    Alhussain, H., Mise, T., Matsuo, Y., Kiyono, H., Nishikiori, K. & Akashi, T., 2019 Jan 1, In : Journal of the Ceramic Society of Japan. 127, 11, p. 824-829 6 p.

    Research output: Contribution to journalArticle

    Open Access
  • Influence of post-deposition annealing on characteristics of Pt/Al2O3/β-Ga2O3 MOS capacitors

    Hirose, M., Nabatame, T., Yuge, K., Maeda, E., Ohi, A., Ikeda, N., Irokawa, Y., Iwai, H., Yasufuku, H., Kawada, S., Takahashi, M., Ito, K., Koide, Y. & Kiyono, H., 2019 Aug 15, In : Microelectronic Engineering. 216, 111040.

    Research output: Contribution to journalArticle