• 2394 Citations
  • 29 h-Index
1970 …2018

Research output per year

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Research Output

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Conference contribution
2018

Ar-plasma-modulated optical reset in the SiO2/Cu conductive-bridge resistive memory stack

Kawashima, T., Yew, K. S., Zhou, Y., Ang, D. S., Zhang, H. Z. & Kyuno, K., 2018 Jan 1, ECS Transactions. Magyari-Kope, B., Bersuker, G., Kobayashi, K., Hacker, C., Park, J. G., Shingubara, S., Saito, Y., Karim, Z., Shima, H., Kubota, H. & Obeng, Y. S. (eds.). 3 ed. Electrochemical Society Inc., Vol. 86. p. 55-64 10 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2007

Mechanisms of and solutions to moisture absorption of lanthanum oxide as high k gate dielectric

Zhao, Y., Kita, K., Kyuno, K. & Toriumi, A., 2007 Dec 1, ECS Transactions - International Symposium on Advanced Gate Stack, Source/Drain and Channel Engineering for Si-based CMOS: New Materials, Processes and Equipment, 3. 1 ed. p. 141-148 8 p. (ECS Transactions; vol. 6, no. 1).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Citations (Scopus)
2006

Higher-k LaYOx films with strong moisture-robustness

Zhao, Y., Kita, K., Kyuno, K. & Toriumi, A., 2006 Jan 1, ICSICT-2006: 2006 8th International Conference on Solid-State and Integrated Circuit Technology, Proceedings. IEEE Computer Society, p. 427-429 3 p. 4098126. (ICSICT-2006: 2006 8th International Conference on Solid-State and Integrated Circuit Technology, Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2005

Energy level consideration of source/channel/drain for performance enhancements of N- and P-channel organic FETs

Yokoyama, T., Nishimura, T., Kita, K., Kyuno, K. & Toriumi, A., 2005 Dec 1, 63rd Device Research Conference Digest, DRC'05. p. 107-108 2 p. 1553078. (Device Research Conference - Conference Digest, DRC; vol. 2005).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2003

Further EOT scaling of Ge/HfO2 over Si/HfO2 MOS systems

Kita, K., Sasagawa, M., Tomida, K., Tohyama, M., Kyuno, K. & Toriumi, A., 2003, Extended Abstracts of International Workshop on Gate Insulator, IWGI 2003. Institute of Electrical and Electronics Engineers Inc., p. 186-191 6 p. 1252534

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)