2-D simulations of trap-related drain-current transients in GaAs MESFETs and requirements for the substrate in MESFET-ICs

K.Horio K.Horio, Kazushige Horio

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)1-17
JournalReport of Research Laboratory of Engineering
Volume10
Publication statusPublished - 1996 Mar 1

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