40 frames/sec 16×16 temperature probe array using 90nm 1V CMOS for on-line thermal monitoring on VLSI chip

Masahiro Sasaki, Takuro Inoue, Makoto Ikeda, Kunihiro Asada

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper presents a 16×16 temperature probe array using 90nm 1V CMOS, which shows ±1.4°C error for 40 ∼ 110°C temperature range and achieves a temperature distribution measurement at 40 frames/sec. This array is designed and developed for an operating frequency and supply voltage feedback system corresponding to temperature of each block on a VLSI chip. The continuous thermal monitoring is performed by using accurate four-transistor temperature probe circuits with an error amplifier and two PMOS current sources.

Original languageEnglish
Title of host publication2007 IEEE Asian Solid-State Circuits Conference, A-SSCC
Pages264-267
Number of pages4
DOIs
Publication statusPublished - 2007 Dec 1
Externally publishedYes
Event2007 IEEE Asian Solid-State Circuits Conference, A-SSCC - Jeju, Korea, Republic of
Duration: 2007 Nov 122007 Nov 14

Publication series

Name2007 IEEE Asian Solid-State Circuits Conference, A-SSCC

Conference

Conference2007 IEEE Asian Solid-State Circuits Conference, A-SSCC
CountryKorea, Republic of
CityJeju
Period07/11/1207/11/14

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering

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    Sasaki, M., Inoue, T., Ikeda, M., & Asada, K. (2007). 40 frames/sec 16×16 temperature probe array using 90nm 1V CMOS for on-line thermal monitoring on VLSI chip. In 2007 IEEE Asian Solid-State Circuits Conference, A-SSCC (pp. 264-267). [4425781] (2007 IEEE Asian Solid-State Circuits Conference, A-SSCC). https://doi.org/10.1109/ASSCC.2007.4425781