A high-Throughput screening system for thermoelectric material exploration based on a combinatorial film approach

Makoto Otani; Evan L. Thomas; Winnie Wong-Ng; Peter K. Schenck; Kao Shuo Chang; Nathan D. Lowhorn; Martin L. Green; Hiroyuki Ohguchi

doi:10.1143/jjAP.48.05EB02

A high-Throughput screening system for thermoelectric material exploration based on a combinatorial film approach

Makoto Otani, Evan L. Thomas, Winnie Wong-Ng, Peter K. Schenck, Kao Shuo Chang, Nathan D. Lowhorn, Martin L. Green, Hiroyuki Ohguchi

Research output: Contribution to journal › Article › peer-review

11 Citations (Scopus)

Abstract

A high-throughput system that consists of a combinatorial tool (a sputtering deposition tool and a pulsed laser deposition tool) and two developed property screening devices was used for thermoelectric material exploration. The thermoelectric power factor (S²ν, S = Seebeck coefficient, ν = electrical conductivity) screening device allows us to measure electrical conductivity and Seebeck coefficient of over 1000 sample-points within 6h. The thermal effusivity measurement system using the frequency domain thermoreflectance technique allows us to screen thermal conductivity of combinatorial/conventional films. Illustrations of these applications are provided with a Co-Sn-Ce/Si(100) film for power factor determination and with a Ba₂YCu₃O₇/SrTiO₃(100) film for thermal conductivity derivation.

Original language	English
Pages (from-to)	05EB021-05EB024
Journal	Japanese Journal of Applied Physics
Volume	48
Issue number	5 PART 3
DOIs	https://doi.org/10.1143/jjAP.48.05EB02
Publication status	Published - 2009 May
Externally published	Yes

ASJC Scopus subject areas

Engineering(all)
Physics and Astronomy(all)

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abstract = "A high-throughput system that consists of a combinatorial tool (a sputtering deposition tool and a pulsed laser deposition tool) and two developed property screening devices was used for thermoelectric material exploration. The thermoelectric power factor (S2ν, S = Seebeck coefficient, ν = electrical conductivity) screening device allows us to measure electrical conductivity and Seebeck coefficient of over 1000 sample-points within 6h. The thermal effusivity measurement system using the frequency domain thermoreflectance technique allows us to screen thermal conductivity of combinatorial/conventional films. Illustrations of these applications are provided with a Co-Sn-Ce/Si(100) film for power factor determination and with a Ba2YCu3O7/SrTiO3(100) film for thermal conductivity derivation.",

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AU - Chang, Kao Shuo

AU - Lowhorn, Nathan D.

AU - Green, Martin L.

AU - Ohguchi, Hiroyuki

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A high-Throughput screening system for thermoelectric material exploration based on a combinatorial film approach

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