A high-Throughput screening system for thermoelectric material exploration based on a combinatorial film approach

Makoto Otani, Evan L. Thomas, Winnie Wong-Ng, Peter K. Schenck, Kao Shuo Chang, Nathan D. Lowhorn, Martin L. Green, Hiroyuki Ohguchi

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

A high-throughput system that consists of a combinatorial tool (a sputtering deposition tool and a pulsed laser deposition tool) and two developed property screening devices was used for thermoelectric material exploration. The thermoelectric power factor (S2ν, S = Seebeck coefficient, ν = electrical conductivity) screening device allows us to measure electrical conductivity and Seebeck coefficient of over 1000 sample-points within 6h. The thermal effusivity measurement system using the frequency domain thermoreflectance technique allows us to screen thermal conductivity of combinatorial/conventional films. Illustrations of these applications are provided with a Co-Sn-Ce/Si(100) film for power factor determination and with a Ba2YCu3O7/SrTiO3(100) film for thermal conductivity derivation.

Original languageEnglish
Pages (from-to)05EB021-05EB024
JournalJapanese Journal of Applied Physics
Volume48
Issue number5 PART 3
DOIs
Publication statusPublished - 2009 May

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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    Otani, M., Thomas, E. L., Wong-Ng, W., Schenck, P. K., Chang, K. S., Lowhorn, N. D., Green, M. L., & Ohguchi, H. (2009). A high-Throughput screening system for thermoelectric material exploration based on a combinatorial film approach. Japanese Journal of Applied Physics, 48(5 PART 3), 05EB021-05EB024. https://doi.org/10.1143/jjAP.48.05EB02