A low-IF/Zero-IF reconfigurable analog baseband ic with an I/Q imbalance cancellation scheme

Masaki Kitsunezuka, Takashi Tokairin, Tadashi Maeda, Muneo Fukaishi

Research output: Contribution to journalArticle

19 Citations (Scopus)

Abstract

A low-IF/zero-IF reconfigurable analog baseband IC embodying an automatic I/Q imbalance cancellation scheme is reported. The chip, which comprises a down-conversion mixer, an analog baseband filter, and a programmable gain amplifier, achieves a high image rejection of 55 dB without any calibration. It operates over a wide radio frequency range of 0.42.4 GHz, and has a cut-off frequency range of 0.330 MHz in zero-intermediate frequency (IF) mode and an IF range of 0.26 MHz in low-IF mode. The circuit in the receiver chain draws only 4.56.2 mA, and the clock generator including LO buffers draws 1.86.3 mA from a 1.2-V supply. The chip, implemented in 90-nm CMOS technology, occupies an area of 1.1 mm2.

Original languageEnglish
Article number5708186
Pages (from-to)572-582
Number of pages11
JournalIEEE Journal of Solid-State Circuits
Volume46
Issue number3
DOIs
Publication statusPublished - 2011 Mar
Externally publishedYes

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Cutoff frequency
Clocks
Calibration
Networks (circuits)
Analog integrated circuits

Keywords

  • Analog baseband
  • duty-cycle control
  • dynamic matching
  • image rejection
  • low-IF
  • reconfigurable filter
  • software-defined radio
  • zero-IF

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

A low-IF/Zero-IF reconfigurable analog baseband ic with an I/Q imbalance cancellation scheme. / Kitsunezuka, Masaki; Tokairin, Takashi; Maeda, Tadashi; Fukaishi, Muneo.

In: IEEE Journal of Solid-State Circuits, Vol. 46, No. 3, 5708186, 03.2011, p. 572-582.

Research output: Contribution to journalArticle

Kitsunezuka, Masaki ; Tokairin, Takashi ; Maeda, Tadashi ; Fukaishi, Muneo. / A low-IF/Zero-IF reconfigurable analog baseband ic with an I/Q imbalance cancellation scheme. In: IEEE Journal of Solid-State Circuits. 2011 ; Vol. 46, No. 3. pp. 572-582.
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