A robust embedded ladder-oxide/Cu multilevel interconnect technology for 0.13 μm complementary metal oxide semiconductor generation

Noriaki Oda; Shinya Ito; Toshiyuki Takewaki; Kazutoshi Shiba; Hiroyuki Kunishima; Nobuo Hironaga; Ichiro Honma; Hiroaki Nanba; Shinji Yokogawa; Akiko Kameyama; Takayuki Goto; Tatsuya Usami; Koichi Ohto; Akira Kubo; Mieko Suzuki; Yoshiaki Yamamoto; Susumu Watanabe; Kenta Yamada; Masahiro Ikeda; Kazuyoshi Ueno; Tadahiko Horiuchi

doi:10.1143/JJAP.46.954

A robust embedded ladder-oxide/Cu multilevel interconnect technology for 0.13 μm complementary metal oxide semiconductor generation

Noriaki Oda, Shinya Ito, Toshiyuki Takewaki, Kazutoshi Shiba, Hiroyuki Kunishima, Nobuo Hironaga, Ichiro Honma, Hiroaki Nanba, Shinji Yokogawa, Akiko Kameyama, Takayuki Goto, Tatsuya Usami, Koichi Ohto, Akira Kubo, Mieko Suzuki, Yoshiaki Yamamoto, Susumu Watanabe, Kenta Yamada, Masahiro Ikeda, Kazuyoshi UenoTadahiko Horiuchi

Research output: Contribution to journal › Article › peer-review

9 Citations (Scopus)

Abstract

A robust embedded ladder-oxide {k = 2.9)/copper (Cu) multilevel interconnect is demonstrated for 0.13 μm complementary metal oxide semiconductor (CMOS) generation. A stable ladder-oxide intermetal dielectric (IMD) is integrated by the Cu metallization with a minimum wiring pitch of 0.34 μm, and a single damascene (S/D) Cu-plug structure is applied. An 18% reduction in wiring capacitance is obtained compared with that in SiO ₂ IMDs. The superior controllability of metal thickness by the S/D process enables us to enhance the MPU maximum frequency easily. The stress-migration lifetime of vias on wide metals for the S/D Cu-plug structure is longer than that for a dual damascene (D/D) structure. Reliability test results such as electromigration (EM), the temperature dependant dielectric breakdown (TDDB) of Cu interconnects, and pressure cooker test (PCT) results are acceptable. Moreover, a high flexibility in a thermal design is obtained.

Original language	English
Pages (from-to)	954-961
Number of pages	8
Journal	Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume	46
Issue number	3 A
DOIs	https://doi.org/10.1143/JJAP.46.954
Publication status	Published - 2007 Mar 8

Keywords

0.13μm node
CMOS
Complementary metal oxide semiconductor
Copper plug
Cu interconnect
Ladder-oxide
Low-k
Single damascene

ASJC Scopus subject areas

Engineering(all)
Physics and Astronomy(all)

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10.1143/JJAP.46.954

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Oda, N., Ito, S., Takewaki, T., Shiba, K., Kunishima, H., Hironaga, N., Honma, I., Nanba, H., Yokogawa, S., Kameyama, A., Goto, T., Usami, T., Ohto, K., Kubo, A., Suzuki, M., Yamamoto, Y., Watanabe, S., Yamada, K., Ikeda, M., ... Horiuchi, T. (2007). A robust embedded ladder-oxide/Cu multilevel interconnect technology for 0.13 μm complementary metal oxide semiconductor generation. Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 46(3 A), 954-961. https://doi.org/10.1143/JJAP.46.954

A robust embedded ladder-oxide/Cu multilevel interconnect technology for 0.13 μm complementary metal oxide semiconductor generation. / Oda, Noriaki; Ito, Shinya; Takewaki, Toshiyuki et al.

In: Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, Vol. 46, No. 3 A, 08.03.2007, p. 954-961.

Research output: Contribution to journal › Article › peer-review

Oda, N, Ito, S, Takewaki, T, Shiba, K, Kunishima, H, Hironaga, N, Honma, I, Nanba, H, Yokogawa, S, Kameyama, A, Goto, T, Usami, T, Ohto, K, Kubo, A, Suzuki, M, Yamamoto, Y, Watanabe, S, Yamada, K, Ikeda, M, Ueno, K & Horiuchi, T 2007, 'A robust embedded ladder-oxide/Cu multilevel interconnect technology for 0.13 μm complementary metal oxide semiconductor generation', Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, vol. 46, no. 3 A, pp. 954-961. https://doi.org/10.1143/JJAP.46.954

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abstract = "A robust embedded ladder-oxide {k = 2.9)/copper (Cu) multilevel interconnect is demonstrated for 0.13 μm complementary metal oxide semiconductor (CMOS) generation. A stable ladder-oxide intermetal dielectric (IMD) is integrated by the Cu metallization with a minimum wiring pitch of 0.34 μm, and a single damascene (S/D) Cu-plug structure is applied. An 18% reduction in wiring capacitance is obtained compared with that in SiO 2 IMDs. The superior controllability of metal thickness by the S/D process enables us to enhance the MPU maximum frequency easily. The stress-migration lifetime of vias on wide metals for the S/D Cu-plug structure is longer than that for a dual damascene (D/D) structure. Reliability test results such as electromigration (EM), the temperature dependant dielectric breakdown (TDDB) of Cu interconnects, and pressure cooker test (PCT) results are acceptable. Moreover, a high flexibility in a thermal design is obtained.",

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AU - Kunishima, Hiroyuki

AU - Hironaga, Nobuo

AU - Honma, Ichiro

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AU - Yokogawa, Shinji

AU - Kameyama, Akiko

AU - Goto, Takayuki

AU - Usami, Tatsuya

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AU - Suzuki, Mieko

AU - Yamamoto, Yoshiaki

AU - Watanabe, Susumu

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AU - Ueno, Kazuyoshi

AU - Horiuchi, Tadahiko

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N2 - A robust embedded ladder-oxide {k = 2.9)/copper (Cu) multilevel interconnect is demonstrated for 0.13 μm complementary metal oxide semiconductor (CMOS) generation. A stable ladder-oxide intermetal dielectric (IMD) is integrated by the Cu metallization with a minimum wiring pitch of 0.34 μm, and a single damascene (S/D) Cu-plug structure is applied. An 18% reduction in wiring capacitance is obtained compared with that in SiO 2 IMDs. The superior controllability of metal thickness by the S/D process enables us to enhance the MPU maximum frequency easily. The stress-migration lifetime of vias on wide metals for the S/D Cu-plug structure is longer than that for a dual damascene (D/D) structure. Reliability test results such as electromigration (EM), the temperature dependant dielectric breakdown (TDDB) of Cu interconnects, and pressure cooker test (PCT) results are acceptable. Moreover, a high flexibility in a thermal design is obtained.

AB - A robust embedded ladder-oxide {k = 2.9)/copper (Cu) multilevel interconnect is demonstrated for 0.13 μm complementary metal oxide semiconductor (CMOS) generation. A stable ladder-oxide intermetal dielectric (IMD) is integrated by the Cu metallization with a minimum wiring pitch of 0.34 μm, and a single damascene (S/D) Cu-plug structure is applied. An 18% reduction in wiring capacitance is obtained compared with that in SiO 2 IMDs. The superior controllability of metal thickness by the S/D process enables us to enhance the MPU maximum frequency easily. The stress-migration lifetime of vias on wide metals for the S/D Cu-plug structure is longer than that for a dual damascene (D/D) structure. Reliability test results such as electromigration (EM), the temperature dependant dielectric breakdown (TDDB) of Cu interconnects, and pressure cooker test (PCT) results are acceptable. Moreover, a high flexibility in a thermal design is obtained.

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A robust embedded ladder-oxide/Cu multilevel interconnect technology for 0.13 μm complementary metal oxide semiconductor generation

Abstract

Keywords

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