A Thermal Measurement System for Nano-meter Scale Area Evaluation

Kastuhiro Tanaka, Sumito Nagasawa, Takahito Ono, Hiroki Kuwano

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)337
JournalAbstract Book of The International Conference on Nanoscience and Technology (ICN+T2006)
Publication statusPublished - 2006 Apr 1

Cite this

A Thermal Measurement System for Nano-meter Scale Area Evaluation. / Tanaka, Kastuhiro; Nagasawa, Sumito; Ono, Takahito; Kuwano, Hiroki.

In: Abstract Book of The International Conference on Nanoscience and Technology (ICN+T2006), 01.04.2006, p. 337.

Research output: Contribution to journalArticle

@article{76e13b0e804244d198b5c0a0ccfb3b19,
title = "A Thermal Measurement System for Nano-meter Scale Area Evaluation",
author = "Kastuhiro Tanaka and Sumito Nagasawa and Takahito Ono and Hiroki Kuwano",
year = "2006",
month = "4",
day = "1",
language = "English",
pages = "337",
journal = "Abstract Book of The International Conference on Nanoscience and Technology (ICN+T2006)",

}

TY - JOUR

T1 - A Thermal Measurement System for Nano-meter Scale Area Evaluation

AU - Tanaka, Kastuhiro

AU - Nagasawa, Sumito

AU - Ono, Takahito

AU - Kuwano, Hiroki

PY - 2006/4/1

Y1 - 2006/4/1

M3 - Article

SP - 337

JO - Abstract Book of The International Conference on Nanoscience and Technology (ICN+T2006)

JF - Abstract Book of The International Conference on Nanoscience and Technology (ICN+T2006)

ER -