A Thermal Measurement System for Nano-meter Scale Area Evaluation

Kastuhiro Tanaka, Sumito Nagasawa, Takahito Ono, Hiroki Kuwano

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)337
JournalAbstract Book of The International Conference on Nanoscience and Technology (ICN+T2006)
Publication statusPublished - 2006 Apr 1

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