Aberration-corrected scanning confocal electron microscopy for three-dimensional imaging and analysis of materials

P. D. Nellist; P. D.Nellist;P.Wang;A.I. Kirkl; ; A.J.D’Alfonso;A.J.Morgan;L.J.Allen;A.Hashimoto;M.T Shimojo

Aberration-corrected scanning confocal electron microscopy for three-dimensional imaging and analysis of materials

P. D. Nellist, P. D.Nellist;P.Wang;A.I. Kirkl, ; A.J.D’Alfonso;A.J.Morgan;L.J.Allen;A.Hashimoto;M.T Shimojo

Functional Control Systems

Research output: Contribution to journal › Article › peer-review

Original language	English
Journal	Default journal
Publication status	Published - 2011 Sept 18

Cite this

@article{e6557931558245379527d43c254a9e0d,

title = "Aberration-corrected scanning confocal electron microscopy for three-dimensional imaging and analysis of materials",

author = "Nellist, {P. D.} and Kirkl, {P. D.Nellist;P.Wang;A.I.} and Shimojo, {; A.J.D{\textquoteright}Alfonso;A.J.Morgan;L.J.Allen;A.Hashimoto;M.T}",

year = "2011",

month = sep,

day = "18",

language = "English",

journal = "Default journal",

}