Aberration-corrected scanning confocal electron microscopy for three-dimensional imaging and analysis of materials

P. D. Nellist, P. D.Nellist;P.Wang;A.I. Kirkl, ; A.J.D’Alfonso;A.J.Morgan;L.J.Allen;A.Hashimoto;M.T Shimojo

Research output: Contribution to journalArticle

Original languageEnglish
JournalDefault journal
Publication statusPublished - 2011 Sep 18

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