Original language | English |
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Pages (from-to) | 856-857 |
Journal | Extended Abstracts of 2004 International Conference on Solid State Devices and Materials (SSDM) |
Publication status | Published - 2004 Sep 1 |
Cite this
Accumulated Carrier Density Dependence of Pentacene TFT Mobility Determined by Split C-V Technique. / Yokoyama, T.; Nishimura, T.; Kita, K.; Kyuno, K.; Toriumi, A.
In: Extended Abstracts of 2004 International Conference on Solid State Devices and Materials (SSDM), 01.09.2004, p. 856-857.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Accumulated Carrier Density Dependence of Pentacene TFT Mobility Determined by Split C-V Technique
AU - Yokoyama, T.
AU - Nishimura, T.
AU - Kita, K.
AU - Kyuno, K.
AU - Toriumi, A.
PY - 2004/9/1
Y1 - 2004/9/1
M3 - Article
SP - 856
EP - 857
JO - Extended Abstracts of 2004 International Conference on Solid State Devices and Materials (SSDM)
JF - Extended Abstracts of 2004 International Conference on Solid State Devices and Materials (SSDM)
ER -