| Original language | English |
|---|---|
| Pages (from-to) | 856-857 |
| Journal | Extended Abstracts of 2004 International Conference on Solid State Devices and Materials (SSDM) |
| Publication status | Published - 2004 Sep 1 |
Cite this
Yokoyama, T., Nishimura, T., Kita, K., Kyuno, K., & Toriumi, A. (2004). Accumulated Carrier Density Dependence of Pentacene TFT Mobility Determined by Split C-V Technique. Extended Abstracts of 2004 International Conference on Solid State Devices and Materials (SSDM), 856-857.
Accumulated Carrier Density Dependence of Pentacene TFT Mobility Determined by Split C-V Technique. / Yokoyama, T.; Nishimura, T.; Kita, K.; Kyuno, K.; Toriumi, A.
In: Extended Abstracts of 2004 International Conference on Solid State Devices and Materials (SSDM), 01.09.2004, p. 856-857.Research output: Contribution to journal › Article
Yokoyama, T, Nishimura, T, Kita, K, Kyuno, K & Toriumi, A 2004, 'Accumulated Carrier Density Dependence of Pentacene TFT Mobility Determined by Split C-V Technique', Extended Abstracts of 2004 International Conference on Solid State Devices and Materials (SSDM), pp. 856-857.
Yokoyama T, Nishimura T, Kita K, Kyuno K, Toriumi A. Accumulated Carrier Density Dependence of Pentacene TFT Mobility Determined by Split C-V Technique. Extended Abstracts of 2004 International Conference on Solid State Devices and Materials (SSDM). 2004 Sep 1;856-857.
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title = "Accumulated Carrier Density Dependence of Pentacene TFT Mobility Determined by Split C-V Technique",
author = "T. Yokoyama and T. Nishimura and K. Kita and K. Kyuno and A. Toriumi",
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journal = "Extended Abstracts of 2004 International Conference on Solid State Devices and Materials (SSDM)",
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AU - Yokoyama, T.
AU - Nishimura, T.
AU - Kita, K.
AU - Kyuno, K.
AU - Toriumi, A.
PY - 2004/9/1
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JO - Extended Abstracts of 2004 International Conference on Solid State Devices and Materials (SSDM)
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