Abstract
Surface magic clusters (SMCs) of In on Si(111)-7 × 7 surfaces and adhesion of subsequently deposited Ag atoms to them, were observed and analyzed by scanning tunneling microscopy (STM), transmission electron microscopy (TEM) and electron energy loss spectroscopy (EELS). Formation of In SMCs on faulted halves of 7 × 7 unit cells was confirmed by both STM images and transmission diffraction patterns. By subsequent Ag deposition, adhesion of Ag atoms onto preexisting In SMCs was observed. Corresponding diffraction pattern suggests that Ag atoms captured in the In SMCs have characteristic atomic structure which is different from known Ag-In alloy phase. The changes in EELS spectrum are also discussed.
| Original language | English |
|---|---|
| Pages (from-to) | 1520-1523 |
| Number of pages | 4 |
| Journal | Surface and Interface Analysis |
| Volume | 42 |
| Issue number | 10-11 |
| DOIs | |
| Publication status | Published - 2010 Oct 1 |
| Externally published | Yes |
Keywords
- EELS
- STM
- Surface magic clusters
- UHV-TEM
ASJC Scopus subject areas
- Chemistry(all)
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Materials Chemistry