Advanced time-stamped total data acquisition control front-end for MeV ion beam microscopy and proton beam writing

Henri Kivistö, Mikko Rossi, Pete Jones, Rattanaporn Norarat, Nitipon Puttaraksa, Timo Sajavaara, Mikko Laitinen, Väinö Hänninen, Kimmo Ranttila, Pauli Heikkinen, Leona Gilbert, Varpu Marjomäki, Harry J. Whitlow

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Abstract

Many ion-matter interactions exhibit sub-μs time dependences such as, fluorophore emission quenching and ion beam induced charge (IBIC). Conventional event-mode MeV ion microbeam data acquisition systems discard the time information. Here we describe a fast time-stamping data acquisition front-end based on the concurrent processing capabilities of a Field Programmable Gate Array (FPGA). The system is intended for MeV ion microscopy and MeV ion beam lithography. The speed of the system (>240,000 events s -1 for four analogue to digital converters (ADC)) is limited by the ADC throughput and data handling speed of the host computer.

Original languageEnglish
Pages (from-to)9-11
Number of pages3
JournalMicroelectronic Engineering
Volume102
DOIs
Publication statusPublished - 2013 Feb
Externally publishedYes

Keywords

  • Data acquisition
  • FPGA
  • Front-end
  • Microbeam
  • Time-stamping

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Surfaces, Coatings and Films
  • Electrical and Electronic Engineering

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