Advanced time-stamped total data acquisition control front-end for MeV ion beam microscopy and proton beam writing

Henri Kivistö; Mikko Rossi; Pete Jones; Rattanaporn Norarat; Nitipon Puttaraksa; Timo Sajavaara; Mikko Laitinen; Väinö Hänninen; Kimmo Ranttila; Pauli Heikkinen; Leona Gilbert; Varpu Marjomäki; Harry J. Whitlow

doi:10.1016/j.mee.2012.02.011

Advanced time-stamped total data acquisition control front-end for MeV ion beam microscopy and proton beam writing

Henri Kivistö, Mikko Rossi, Pete Jones, Rattanaporn Norarat, Nitipon Puttaraksa, Timo Sajavaara, Mikko Laitinen, Väinö Hänninen, Kimmo Ranttila, Pauli Heikkinen, Leona Gilbert, Varpu Marjomäki, Harry J. Whitlow

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

Many ion-matter interactions exhibit sub-μs time dependences such as, fluorophore emission quenching and ion beam induced charge (IBIC). Conventional event-mode MeV ion microbeam data acquisition systems discard the time information. Here we describe a fast time-stamping data acquisition front-end based on the concurrent processing capabilities of a Field Programmable Gate Array (FPGA). The system is intended for MeV ion microscopy and MeV ion beam lithography. The speed of the system (>240,000 events s ^-1 for four analogue to digital converters (ADC)) is limited by the ADC throughput and data handling speed of the host computer.

Original language	English
Pages (from-to)	9-11
Number of pages	3
Journal	Microelectronic Engineering
Volume	102
DOIs	https://doi.org/10.1016/j.mee.2012.02.011
Publication status	Published - 2013 Feb
Externally published	Yes

Keywords

Data acquisition
FPGA
Front-end
Microbeam
Time-stamping

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Condensed Matter Physics
Surfaces, Coatings and Films
Electrical and Electronic Engineering

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10.1016/j.mee.2012.02.011

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Kivistö, H., Rossi, M., Jones, P., Norarat, R., Puttaraksa, N., Sajavaara, T., Laitinen, M., Hänninen, V., Ranttila, K., Heikkinen, P., Gilbert, L., Marjomäki, V., & Whitlow, H. J. (2013). Advanced time-stamped total data acquisition control front-end for MeV ion beam microscopy and proton beam writing. Microelectronic Engineering, 102, 9-11. https://doi.org/10.1016/j.mee.2012.02.011

Kivistö, H, Rossi, M, Jones, P, Norarat, R, Puttaraksa, N, Sajavaara, T, Laitinen, M, Hänninen, V, Ranttila, K, Heikkinen, P, Gilbert, L, Marjomäki, V & Whitlow, HJ 2013, 'Advanced time-stamped total data acquisition control front-end for MeV ion beam microscopy and proton beam writing', Microelectronic Engineering, vol. 102, pp. 9-11. https://doi.org/10.1016/j.mee.2012.02.011

@article{a426d998493e428baf598e6a6b2b8218,

title = "Advanced time-stamped total data acquisition control front-end for MeV ion beam microscopy and proton beam writing",

abstract = "Many ion-matter interactions exhibit sub-μs time dependences such as, fluorophore emission quenching and ion beam induced charge (IBIC). Conventional event-mode MeV ion microbeam data acquisition systems discard the time information. Here we describe a fast time-stamping data acquisition front-end based on the concurrent processing capabilities of a Field Programmable Gate Array (FPGA). The system is intended for MeV ion microscopy and MeV ion beam lithography. The speed of the system (>240,000 events s -1 for four analogue to digital converters (ADC)) is limited by the ADC throughput and data handling speed of the host computer.",

keywords = "Data acquisition, FPGA, Front-end, Microbeam, Time-stamping",

author = "Henri Kivist{\"o} and Mikko Rossi and Pete Jones and Rattanaporn Norarat and Nitipon Puttaraksa and Timo Sajavaara and Mikko Laitinen and V{\"a}in{\"o} H{\"a}nninen and Kimmo Ranttila and Pauli Heikkinen and Leona Gilbert and Varpu Marjom{\"a}ki and Whitlow, {Harry J.}",

note = "Funding Information: This work was supported the Academy of Finland, Centre of Excellence in Nuclear and Accelerator Based Physics , Ref. 213503 and Grant No. 129999 .",

year = "2013",

month = feb,

doi = "10.1016/j.mee.2012.02.011",

language = "English",

volume = "102",

pages = "9--11",

journal = "Microelectronic Engineering",

issn = "0167-9317",

publisher = "Elsevier",

}

TY - JOUR

T1 - Advanced time-stamped total data acquisition control front-end for MeV ion beam microscopy and proton beam writing

AU - Kivistö, Henri

AU - Rossi, Mikko

AU - Jones, Pete

AU - Norarat, Rattanaporn

AU - Puttaraksa, Nitipon

AU - Sajavaara, Timo

AU - Laitinen, Mikko

AU - Hänninen, Väinö

AU - Ranttila, Kimmo

AU - Heikkinen, Pauli

AU - Gilbert, Leona

AU - Marjomäki, Varpu

AU - Whitlow, Harry J.

N1 - Funding Information: This work was supported the Academy of Finland, Centre of Excellence in Nuclear and Accelerator Based Physics , Ref. 213503 and Grant No. 129999 .

PY - 2013/2

Y1 - 2013/2

N2 - Many ion-matter interactions exhibit sub-μs time dependences such as, fluorophore emission quenching and ion beam induced charge (IBIC). Conventional event-mode MeV ion microbeam data acquisition systems discard the time information. Here we describe a fast time-stamping data acquisition front-end based on the concurrent processing capabilities of a Field Programmable Gate Array (FPGA). The system is intended for MeV ion microscopy and MeV ion beam lithography. The speed of the system (>240,000 events s -1 for four analogue to digital converters (ADC)) is limited by the ADC throughput and data handling speed of the host computer.

AB - Many ion-matter interactions exhibit sub-μs time dependences such as, fluorophore emission quenching and ion beam induced charge (IBIC). Conventional event-mode MeV ion microbeam data acquisition systems discard the time information. Here we describe a fast time-stamping data acquisition front-end based on the concurrent processing capabilities of a Field Programmable Gate Array (FPGA). The system is intended for MeV ion microscopy and MeV ion beam lithography. The speed of the system (>240,000 events s -1 for four analogue to digital converters (ADC)) is limited by the ADC throughput and data handling speed of the host computer.

KW - Data acquisition

KW - FPGA

KW - Front-end

KW - Microbeam

KW - Time-stamping

UR - http://www.scopus.com/inward/record.url?scp=84869096389&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84869096389&partnerID=8YFLogxK

U2 - 10.1016/j.mee.2012.02.011

DO - 10.1016/j.mee.2012.02.011

M3 - Article

AN - SCOPUS:84869096389

VL - 102

SP - 9

EP - 11

JO - Microelectronic Engineering

JF - Microelectronic Engineering

SN - 0167-9317

ER -

Advanced time-stamped total data acquisition control front-end for MeV ion beam microscopy and proton beam writing

Abstract

Keywords

ASJC Scopus subject areas

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