Abstract
Many ion-matter interactions exhibit sub-μs time dependences such as, fluorophore emission quenching and ion beam induced charge (IBIC). Conventional event-mode MeV ion microbeam data acquisition systems discard the time information. Here we describe a fast time-stamping data acquisition front-end based on the concurrent processing capabilities of a Field Programmable Gate Array (FPGA). The system is intended for MeV ion microscopy and MeV ion beam lithography. The speed of the system (>240,000 events s -1 for four analogue to digital converters (ADC)) is limited by the ADC throughput and data handling speed of the host computer.
Original language | English |
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Pages (from-to) | 9-11 |
Number of pages | 3 |
Journal | Microelectronic Engineering |
Volume | 102 |
DOIs | |
Publication status | Published - 2013 Feb |
Externally published | Yes |
Keywords
- Data acquisition
- FPGA
- Front-end
- Microbeam
- Time-stamping
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Condensed Matter Physics
- Surfaces, Coatings and Films
- Electrical and Electronic Engineering