Allowable received OTDR light power for in-service measurement in lightwave SCM systems

Fumihiko Yamamoto, Tsuneo Horiguchi

Research output: Contribution to journalArticle

13 Citations (Scopus)

Abstract

To measure in-service optical transmission lines in optical video distribution systems using subcarrier multiplexing (SCM) techniques, we clarify how measurement light from an optical time domain reflectometer (OTDR) affects the signal transmission performance when the light enters an optical network unit (ONU). We describe the additional noises induced when OTDR light is injected into the ONU and analyze the relationship between received OTDR light power and carrier-to-noise ratio. Moreover, we use the analysis to provide a technique for estimating the allowable received light power in lightwave SCM systems and show the dominant factors determining this allowable power. Finally, by using the estimation technique, we clarify the required rejection ratio for a filter designed to prevent OTDR light from entering ONU's in wavelength division multiplexing systems.

Original languageEnglish
Pages (from-to)286-294
Number of pages9
JournalJournal of Lightwave Technology
Volume18
Issue number3
DOIs
Publication statusPublished - 2000 Mar
Externally publishedYes

Fingerprint

reflectometers
Reflectometers
multiplexing
Multiplexing
Fiber optic networks
Light measurement
Light transmission
Wavelength division multiplexing
carrier to noise ratios
Electric lines
signal transmission
wavelength division multiplexing
rejection
transmission lines
estimating
filters

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Atomic and Molecular Physics, and Optics

Cite this

Allowable received OTDR light power for in-service measurement in lightwave SCM systems. / Yamamoto, Fumihiko; Horiguchi, Tsuneo.

In: Journal of Lightwave Technology, Vol. 18, No. 3, 03.2000, p. 286-294.

Research output: Contribution to journalArticle

Yamamoto, Fumihiko ; Horiguchi, Tsuneo. / Allowable received OTDR light power for in-service measurement in lightwave SCM systems. In: Journal of Lightwave Technology. 2000 ; Vol. 18, No. 3. pp. 286-294.
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