An electron backscatter diffraction investigation of crystallographic orientations of embedded nanoparticles within melt-textured YBCO high temperature superconductors

A. Koblischka-Veneva, M. R. Koblischka, N. Hari Babu, D. A. Cardwell, L. Shlyk, G. Krabbes

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Microstructures of melt-textured YBCO samples with embedded nanosized particles of Y2BaCuO5 (Y-211) and Y2Ba 4CuMOx (M-2411 with M ≤ U,Zr) are analysed by means of electron backscatter diffraction (EBSD). With the recent developments of the EBSD technique, we can directly measure the crystallographic orientation of the embedded nanoparticles, employing a spatial resolution of about 40 nm. The high image quality of the Kikuchi patterns allows true three-phase (YBCO, Y-211 and M-2411) scans to be performed. The Y-211 particles do not exhibit any preferred orientation, even if their size is considerably reduced, to the 100 nm range. The size reduction reduces the negative influence of the Y-211 particles on the YBCO matrix, however. U-2411 particles, which are formed during the processing stage, do not show any orientation, and with increasing concentration, some texture develops. In contrast to this, embedded Zr-2411 particles are fully oriented in the (001) orientation according to the surrounding superconducting matrix.

Original languageEnglish
Pages (from-to)S562-S566
JournalSuperconductor Science and Technology
Issue number7
Publication statusPublished - 2006 Jul 1


ASJC Scopus subject areas

  • Ceramics and Composites
  • Condensed Matter Physics
  • Metals and Alloys
  • Electrical and Electronic Engineering
  • Materials Chemistry

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