Analysis of buffer-trapping effects on current collapse of GaN FETs

Kazushige Horio, H. Takayanagi, H. Nakano

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

Two-dimensional transient simulation of GaN MESFETs is performed in which a deep donor and a deep acceptor in a semi-insulating buffer layer are considered. Quasi-pulsed I-V curves are derived from the transient characteristics, and are compared with the steady-state I-V curves. It is shown that the current collapse is more pronounced when the deep-acceptor density in the buffer layer is higher and when an off-state drain voltage is higher, because the trapping effects become more significant. It is suggested that to minimize current collapse in GaN-based FETs, an acceptor density in a semi-insulating GaN layer should be made low, although the current cutoff behaviour may be degraded.

Original languageEnglish
Pages (from-to)2346-2349
Number of pages4
JournalPhysica Status Solidi (C) Current Topics in Solid State Physics
Volume3
DOIs
Publication statusPublished - 2006

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field effect transistors
buffers
trapping
curves
high voltages
cut-off
simulation

ASJC Scopus subject areas

  • Condensed Matter Physics

Cite this

Analysis of buffer-trapping effects on current collapse of GaN FETs. / Horio, Kazushige; Takayanagi, H.; Nakano, H.

In: Physica Status Solidi (C) Current Topics in Solid State Physics, Vol. 3, 2006, p. 2346-2349.

Research output: Contribution to journalArticle

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