Analysis of drain lag and power compression in GaN MESFET

K. Horio, K. Yonemoto

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)567-569
JournalProceedings of the 12th European Gallium Arsenide & Other Semiconductor Application Symposium (GAAS 2004), Amsterdam The Netherlands
Publication statusPublished - 2004 Oct 1

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