Analysis of grain shape and orientation in BaFe12O 19-ferrites using electron backscatter diffraction (EBSD)

A. Koblischka-Veneva, M. R. Koblischka, Y. Chen, V. G. Harris

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

The electron backscatter diffraction (EBSD) technique enables an advanced analysis of anisotropic materials like ferrites. Here, the spatially highly resolved EBSD mappings provide additional information as compared to the standard analysis techniques, which can contribute to an optimization of the growth process. Furthermore, an analysis of the grain aspect ratio is possible which provides further insight to the microstructural dependence of the magnetic properties of ferrites.

Original languageEnglish
Article number5257384
Pages (from-to)4219-4222
Number of pages4
JournalIEEE Transactions on Magnetics
Volume45
Issue number10
DOIs
Publication statusPublished - 2009 Oct 1

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Keywords

  • Crystal growth
  • Electron backscatter diffraction
  • Electron microscopy
  • Ferrite
  • Position measurement

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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