Abstract
The electron backscatter diffraction (EBSD) technique enables an advanced analysis of anisotropic materials like ferrites. Here, the spatially highly resolved EBSD mappings provide additional information as compared to the standard analysis techniques, which can contribute to an optimization of the growth process. Furthermore, an analysis of the grain aspect ratio is possible which provides further insight to the microstructural dependence of the magnetic properties of ferrites.
Original language | English |
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Article number | 5257384 |
Pages (from-to) | 4219-4222 |
Number of pages | 4 |
Journal | IEEE Transactions on Magnetics |
Volume | 45 |
Issue number | 10 |
DOIs | |
Publication status | Published - 2009 Oct |
Externally published | Yes |
Keywords
- Crystal growth
- Electron backscatter diffraction
- Electron microscopy
- Ferrite
- Position measurement
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering