Analysis of influence that strong magnetic field environment causes to noise measurement system

Kenji Muto, Kazuo Yagi, Kentaro Eguchi, Kunihiko Takano

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)325-330
JournalProc. of VSTech 2005
Volume227
Publication statusPublished - 2005 Jun 1

Cite this

Analysis of influence that strong magnetic field environment causes to noise measurement system. / Muto, Kenji; Yagi, Kazuo; Eguchi, Kentaro; Takano, Kunihiko.

In: Proc. of VSTech 2005, Vol. 227, 01.06.2005, p. 325-330.

Research output: Contribution to journalArticle

Muto, Kenji ; Yagi, Kazuo ; Eguchi, Kentaro ; Takano, Kunihiko. / Analysis of influence that strong magnetic field environment causes to noise measurement system. In: Proc. of VSTech 2005. 2005 ; Vol. 227. pp. 325-330.
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