Analysis of influence that strong magnetic field environment causes to noise measurement system

Kenji Muto, Kazuo Yagi, Kentaro Eguchi, Kunihiko Takano

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)325-330
JournalProc. of VSTech 2005
Volume227
Publication statusPublished - 2005 Jun 1

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