Analysis of Kink-Related Backgating Effect in GaAs MESFET

Kazushige Horio, Kazuoki Usami

Research output: Contribution to journalArticlepeer-review

5 Citations (Scopus)

Abstract

Two-dimensional simulation of backgating effect in a GaAs MESFET. is made in which impact ionization of carriers and deep donors “EL2” in the substrate are considered. The kink-related backgating is reproduced, which is qualitatively consistent with recent experiments. Based on the simulated results, physical mechanism of kink-related backgating effect is discussed.

Original languageEnglish
Pages (from-to)277-279
Number of pages3
JournalIEEE Electron Device Letters
Volume16
Issue number6
DOIs
Publication statusPublished - 1995 Jun

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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