Analysis of lags and current collapse in source-field-plate AlGaN/GaN HEMTs

H. Hanawa, H. Onodera, K. Horio

Research output: Contribution to journalArticle

Original languageEnglish
JournalProceedings of 2012 International Workshop on Nitride Semiconductors, Sapporo, Japan
Publication statusPublished - 2012 Oct 15

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