Analysis of twin boundaries using the electron backscatter diffraction (EBSD) technique

A. Koblischka-Veneva; M. R. Koblischka

doi:10.1016/j.mseb.2008.02.009

Analysis of twin boundaries using the electron backscatter diffraction (EBSD) technique

A. Koblischka-Veneva, M. R. Koblischka

Research output: Contribution to journal › Article

9 Citations (Scopus)

Abstract

The twin structure of various bulk, high-T_c superconductors is analysed using the electron backscatter diffraction (EBSD) technique. The high image quality of the Kikuchi patterns recorded enables a high spatial resolution of the order of 40 nm to be achieved; thus details of the twin patterns can be measured in straightforward way. As samples, we employed both melt-textured samples and single crystals of NdBa₂Cu₃O_y (NdBCO) and (Nd_0.33Eu_0.33Gd_0.33)Ba₂ Cu₃O_y (NEG). Both types of samples show a well-developed twin structure, where several details can be observed using the so-called crystal direction (CD) mappings, which provide orientation maps using colours close to the pole directions. These results are compared to theoretical descriptions found in the literature.

Original language	English
Pages (from-to)	60-64
Number of pages	5
Journal	Materials Science and Engineering B: Solid-State Materials for Advanced Technology
Volume	151
Issue number	1
DOIs	https://doi.org/10.1016/j.mseb.2008.02.009
Publication status	Published - 2008 Jun 15
Externally published	Yes

Keywords

EBSD
Orientation
Twins
YBCO

ASJC Scopus subject areas

Materials Science(all)
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering

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10.1016/j.mseb.2008.02.009

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Koblischka-Veneva, A., & Koblischka, M. R. (2008). Analysis of twin boundaries using the electron backscatter diffraction (EBSD) technique. Materials Science and Engineering B: Solid-State Materials for Advanced Technology, 151(1), 60-64. https://doi.org/10.1016/j.mseb.2008.02.009

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