Abstract
The twin structure of various bulk, high-Tc superconductors is analysed using the electron backscatter diffraction (EBSD) technique. The high image quality of the Kikuchi patterns recorded enables a high spatial resolution of the order of 40 nm to be achieved; thus details of the twin patterns can be measured in straightforward way. As samples, we employed both melt-textured samples and single crystals of NdBa2Cu3Oy (NdBCO) and (Nd0.33Eu0.33Gd0.33)Ba2 Cu3Oy (NEG). Both types of samples show a well-developed twin structure, where several details can be observed using the so-called crystal direction (CD) mappings, which provide orientation maps using colours close to the pole directions. These results are compared to theoretical descriptions found in the literature.
| Original language | English |
|---|---|
| Pages (from-to) | 60-64 |
| Number of pages | 5 |
| Journal | Materials Science and Engineering B: Solid-State Materials for Advanced Technology |
| Volume | 151 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 2008 Jun 15 |
| Externally published | Yes |
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Keywords
- EBSD
- Orientation
- Twins
- YBCO
ASJC Scopus subject areas
- Materials Science(all)
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering
Cite this
Analysis of twin boundaries using the electron backscatter diffraction (EBSD) technique. / Koblischka-Veneva, Anjela Dimitrova; Koblischka, Michael Rudolf.
In: Materials Science and Engineering B: Solid-State Materials for Advanced Technology, Vol. 151, No. 1, 15.06.2008, p. 60-64.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Analysis of twin boundaries using the electron backscatter diffraction (EBSD) technique
AU - Koblischka-Veneva, Anjela Dimitrova
AU - Koblischka, Michael Rudolf
PY - 2008/6/15
Y1 - 2008/6/15
N2 - The twin structure of various bulk, high-Tc superconductors is analysed using the electron backscatter diffraction (EBSD) technique. The high image quality of the Kikuchi patterns recorded enables a high spatial resolution of the order of 40 nm to be achieved; thus details of the twin patterns can be measured in straightforward way. As samples, we employed both melt-textured samples and single crystals of NdBa2Cu3Oy (NdBCO) and (Nd0.33Eu0.33Gd0.33)Ba2 Cu3Oy (NEG). Both types of samples show a well-developed twin structure, where several details can be observed using the so-called crystal direction (CD) mappings, which provide orientation maps using colours close to the pole directions. These results are compared to theoretical descriptions found in the literature.
AB - The twin structure of various bulk, high-Tc superconductors is analysed using the electron backscatter diffraction (EBSD) technique. The high image quality of the Kikuchi patterns recorded enables a high spatial resolution of the order of 40 nm to be achieved; thus details of the twin patterns can be measured in straightforward way. As samples, we employed both melt-textured samples and single crystals of NdBa2Cu3Oy (NdBCO) and (Nd0.33Eu0.33Gd0.33)Ba2 Cu3Oy (NEG). Both types of samples show a well-developed twin structure, where several details can be observed using the so-called crystal direction (CD) mappings, which provide orientation maps using colours close to the pole directions. These results are compared to theoretical descriptions found in the literature.
KW - EBSD
KW - Orientation
KW - Twins
KW - YBCO
UR - http://www.scopus.com/inward/record.url?scp=47849083492&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=47849083492&partnerID=8YFLogxK
U2 - 10.1016/j.mseb.2008.02.009
DO - 10.1016/j.mseb.2008.02.009
M3 - Article
VL - 151
SP - 60
EP - 64
JO - Materials Science and Engineering B: Solid-State Materials for Advanced Technology
JF - Materials Science and Engineering B: Solid-State Materials for Advanced Technology
SN - 0921-5107
IS - 1
ER -