Anti-resonance peak frequency control by variable on-die capacitance

Wataru Ichimura, Sho Kiyoshige, Masahiro Terasaki, Ryota Kobayashi, Genki Kubo, Hiroki Otsuka, Toshio Sudo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Power integrity design has been becoming important in the advanced CMOS digital systems, because power supply noise induces logic instability and electromagnetic radiation. Especially, anti-resonance peaks in power distribution network (PDN) due to the chip-package interaction induce the unwanted power supply fluctuation, and result in large electromagnetic radiation. In this paper, power supply noises and total impedances of power distribution network (PDN) for the variable structure of on-die capacitances have been examined. In addition, power supply noise and total PDN impedance have been examined by changing the number of power supply terminals. As a result, it has been proved that anti-resonance peaks could be controlled by on-die capacitance and the number of power supply terminals. Simulated anti-resonance peak frequencies were well correlated with the peak frequency spectra of measured power supply noise.

Original languageEnglish
Title of host publicationEMC COMPO 2013 Proceedings - 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits
PublisherIEEE Computer Society
Pages171-174
Number of pages4
ISBN (Print)9781479923151
DOIs
Publication statusPublished - 2013
Event9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, EMC COMPO 2013 - Nara
Duration: 2013 Dec 152013 Dec 18

Other

Other9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, EMC COMPO 2013
CityNara
Period13/12/1513/12/18

Fingerprint

Electric power distribution
Capacitance
Electromagnetic waves
Electric power systems

Keywords

  • Anti-resonance peaks
  • Co-design
  • Power integrity
  • Power supply noises

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering

Cite this

Ichimura, W., Kiyoshige, S., Terasaki, M., Kobayashi, R., Kubo, G., Otsuka, H., & Sudo, T. (2013). Anti-resonance peak frequency control by variable on-die capacitance. In EMC COMPO 2013 Proceedings - 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (pp. 171-174). [6735195] IEEE Computer Society. https://doi.org/10.1109/EMCCompo.2013.6735195

Anti-resonance peak frequency control by variable on-die capacitance. / Ichimura, Wataru; Kiyoshige, Sho; Terasaki, Masahiro; Kobayashi, Ryota; Kubo, Genki; Otsuka, Hiroki; Sudo, Toshio.

EMC COMPO 2013 Proceedings - 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits. IEEE Computer Society, 2013. p. 171-174 6735195.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Ichimura, W, Kiyoshige, S, Terasaki, M, Kobayashi, R, Kubo, G, Otsuka, H & Sudo, T 2013, Anti-resonance peak frequency control by variable on-die capacitance. in EMC COMPO 2013 Proceedings - 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits., 6735195, IEEE Computer Society, pp. 171-174, 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, EMC COMPO 2013, Nara, 13/12/15. https://doi.org/10.1109/EMCCompo.2013.6735195
Ichimura W, Kiyoshige S, Terasaki M, Kobayashi R, Kubo G, Otsuka H et al. Anti-resonance peak frequency control by variable on-die capacitance. In EMC COMPO 2013 Proceedings - 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits. IEEE Computer Society. 2013. p. 171-174. 6735195 https://doi.org/10.1109/EMCCompo.2013.6735195
Ichimura, Wataru ; Kiyoshige, Sho ; Terasaki, Masahiro ; Kobayashi, Ryota ; Kubo, Genki ; Otsuka, Hiroki ; Sudo, Toshio. / Anti-resonance peak frequency control by variable on-die capacitance. EMC COMPO 2013 Proceedings - 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits. IEEE Computer Society, 2013. pp. 171-174
@inproceedings{01672ecb101c4f87a027efabed1db310,
title = "Anti-resonance peak frequency control by variable on-die capacitance",
abstract = "Power integrity design has been becoming important in the advanced CMOS digital systems, because power supply noise induces logic instability and electromagnetic radiation. Especially, anti-resonance peaks in power distribution network (PDN) due to the chip-package interaction induce the unwanted power supply fluctuation, and result in large electromagnetic radiation. In this paper, power supply noises and total impedances of power distribution network (PDN) for the variable structure of on-die capacitances have been examined. In addition, power supply noise and total PDN impedance have been examined by changing the number of power supply terminals. As a result, it has been proved that anti-resonance peaks could be controlled by on-die capacitance and the number of power supply terminals. Simulated anti-resonance peak frequencies were well correlated with the peak frequency spectra of measured power supply noise.",
keywords = "Anti-resonance peaks, Co-design, Power integrity, Power supply noises",
author = "Wataru Ichimura and Sho Kiyoshige and Masahiro Terasaki and Ryota Kobayashi and Genki Kubo and Hiroki Otsuka and Toshio Sudo",
year = "2013",
doi = "10.1109/EMCCompo.2013.6735195",
language = "English",
isbn = "9781479923151",
pages = "171--174",
booktitle = "EMC COMPO 2013 Proceedings - 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits",
publisher = "IEEE Computer Society",

}

TY - GEN

T1 - Anti-resonance peak frequency control by variable on-die capacitance

AU - Ichimura, Wataru

AU - Kiyoshige, Sho

AU - Terasaki, Masahiro

AU - Kobayashi, Ryota

AU - Kubo, Genki

AU - Otsuka, Hiroki

AU - Sudo, Toshio

PY - 2013

Y1 - 2013

N2 - Power integrity design has been becoming important in the advanced CMOS digital systems, because power supply noise induces logic instability and electromagnetic radiation. Especially, anti-resonance peaks in power distribution network (PDN) due to the chip-package interaction induce the unwanted power supply fluctuation, and result in large electromagnetic radiation. In this paper, power supply noises and total impedances of power distribution network (PDN) for the variable structure of on-die capacitances have been examined. In addition, power supply noise and total PDN impedance have been examined by changing the number of power supply terminals. As a result, it has been proved that anti-resonance peaks could be controlled by on-die capacitance and the number of power supply terminals. Simulated anti-resonance peak frequencies were well correlated with the peak frequency spectra of measured power supply noise.

AB - Power integrity design has been becoming important in the advanced CMOS digital systems, because power supply noise induces logic instability and electromagnetic radiation. Especially, anti-resonance peaks in power distribution network (PDN) due to the chip-package interaction induce the unwanted power supply fluctuation, and result in large electromagnetic radiation. In this paper, power supply noises and total impedances of power distribution network (PDN) for the variable structure of on-die capacitances have been examined. In addition, power supply noise and total PDN impedance have been examined by changing the number of power supply terminals. As a result, it has been proved that anti-resonance peaks could be controlled by on-die capacitance and the number of power supply terminals. Simulated anti-resonance peak frequencies were well correlated with the peak frequency spectra of measured power supply noise.

KW - Anti-resonance peaks

KW - Co-design

KW - Power integrity

KW - Power supply noises

UR - http://www.scopus.com/inward/record.url?scp=84897741904&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84897741904&partnerID=8YFLogxK

U2 - 10.1109/EMCCompo.2013.6735195

DO - 10.1109/EMCCompo.2013.6735195

M3 - Conference contribution

SN - 9781479923151

SP - 171

EP - 174

BT - EMC COMPO 2013 Proceedings - 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits

PB - IEEE Computer Society

ER -