Atomically resolved scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope

Peng Wang, Angus I. Kirkland, Peter D. Nellist, Adrian J. D'Alfonso, Andrew J. Morgan, Leslie J. Allen, Ayako Hashimoto, Masaki Takeguchi, Kazutaka Mitsuishi, Masayuki Shimojo

Research output: Contribution to journalArticle

1 Citation (Scopus)
Original languageEnglish
Pages (from-to)376-377
Number of pages2
JournalMicroscopy and Microanalysis
Volume20
Issue number3
DOIs
Publication statusPublished - 2014 Aug 1

ASJC Scopus subject areas

  • Instrumentation

Cite this

Wang, P., Kirkland, A. I., Nellist, P. D., D'Alfonso, A. J., Morgan, A. J., Allen, L. J., Hashimoto, A., Takeguchi, M., Mitsuishi, K., & Shimojo, M. (2014). Atomically resolved scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope. Microscopy and Microanalysis, 20(3), 376-377. https://doi.org/10.1017/S1431927614003602