Atomically resolved scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope

Peng Wang, Angus I. Kirkland, Peter D. Nellist, Adrian J. D'Alfonso, Andrew J. Morgan, Leslie J. Allen, Ayako Hashimoto, Masaki Takeguchi, Kazutaka Mitsuishi, Masayuki Shimojo

Research output: Contribution to journalArticle

1 Citation (Scopus)
Original languageEnglish
Pages (from-to)376-377
Number of pages2
JournalMicroscopy and Microanalysis
Volume20
Issue number3
DOIs
Publication statusPublished - 2014 Aug 1

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Confocal microscopy
Aberrations
Electron microscopy
aberration
Electron microscopes
electron microscopes
Scanning
scanning electron microscopy

ASJC Scopus subject areas

  • Instrumentation

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Atomically resolved scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope. / Wang, Peng; Kirkland, Angus I.; Nellist, Peter D.; D'Alfonso, Adrian J.; Morgan, Andrew J.; Allen, Leslie J.; Hashimoto, Ayako; Takeguchi, Masaki; Mitsuishi, Kazutaka; Shimojo, Masayuki.

In: Microscopy and Microanalysis, Vol. 20, No. 3, 01.08.2014, p. 376-377.

Research output: Contribution to journalArticle

Wang, P, Kirkland, AI, Nellist, PD, D'Alfonso, AJ, Morgan, AJ, Allen, LJ, Hashimoto, A, Takeguchi, M, Mitsuishi, K & Shimojo, M 2014, 'Atomically resolved scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope', Microscopy and Microanalysis, vol. 20, no. 3, pp. 376-377. https://doi.org/10.1017/S1431927614003602
Wang, Peng ; Kirkland, Angus I. ; Nellist, Peter D. ; D'Alfonso, Adrian J. ; Morgan, Andrew J. ; Allen, Leslie J. ; Hashimoto, Ayako ; Takeguchi, Masaki ; Mitsuishi, Kazutaka ; Shimojo, Masayuki. / Atomically resolved scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope. In: Microscopy and Microanalysis. 2014 ; Vol. 20, No. 3. pp. 376-377.
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