Abstract
This paper proposes an automatic testing method in which the testing data is constructed on the basis of state-transition specifications and the testing of real machines with embedded software is automatically performed. In automatic testing based on specifications, in general a test scenario with the same extent of abstraction as the specification is difficult to convert to testing data that can be used by the automatic tester. In the proposed testing method, the event action in the state-transition specification is related to the setting and referral of the memory value in the embedded debugger, which makes it possible to convert the test scenario to testing data and to perform the testing automatically. A CASE tool to support the proposed testing method is realized and its performance is evaluated. The effectiveness and the problems of the proposed testing method are noted.
| Language | English |
|---|---|
| Pages | 64-75 |
| Number of pages | 12 |
| Journal | Electronics and Communications in Japan, Part II: Electronics (English translation of Denshi Tsushin Gakkai Ronbunshi) |
| Volume | 86 |
| Issue number | 9 |
| DOIs | |
| State | Published - 2003 Sep |
| Externally published | Yes |
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Keywords
- Automatic testing
- Embedded software
- State-transition specification
- Testing data generation
ASJC Scopus subject areas
- Electrical and Electronic Engineering
Cite this
Automatic Testing of Embedded Software Based on State-Transition Requirement Specifications. / Nakajima, Tsuyoshi; Bessho, Yuzo; Yamanaka, Hiroshi; Hirota, Kazumi.
In: Electronics and Communications in Japan, Part II: Electronics (English translation of Denshi Tsushin Gakkai Ronbunshi), Vol. 86, No. 9, 09.2003, p. 64-75.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Automatic Testing of Embedded Software Based on State-Transition Requirement Specifications
AU - Nakajima,Tsuyoshi
AU - Bessho,Yuzo
AU - Yamanaka,Hiroshi
AU - Hirota,Kazumi
PY - 2003/9
Y1 - 2003/9
N2 - This paper proposes an automatic testing method in which the testing data is constructed on the basis of state-transition specifications and the testing of real machines with embedded software is automatically performed. In automatic testing based on specifications, in general a test scenario with the same extent of abstraction as the specification is difficult to convert to testing data that can be used by the automatic tester. In the proposed testing method, the event action in the state-transition specification is related to the setting and referral of the memory value in the embedded debugger, which makes it possible to convert the test scenario to testing data and to perform the testing automatically. A CASE tool to support the proposed testing method is realized and its performance is evaluated. The effectiveness and the problems of the proposed testing method are noted.
AB - This paper proposes an automatic testing method in which the testing data is constructed on the basis of state-transition specifications and the testing of real machines with embedded software is automatically performed. In automatic testing based on specifications, in general a test scenario with the same extent of abstraction as the specification is difficult to convert to testing data that can be used by the automatic tester. In the proposed testing method, the event action in the state-transition specification is related to the setting and referral of the memory value in the embedded debugger, which makes it possible to convert the test scenario to testing data and to perform the testing automatically. A CASE tool to support the proposed testing method is realized and its performance is evaluated. The effectiveness and the problems of the proposed testing method are noted.
KW - Automatic testing
KW - Embedded software
KW - State-transition specification
KW - Testing data generation
UR - http://www.scopus.com/inward/record.url?scp=0141637314&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0141637314&partnerID=8YFLogxK
U2 - 10.1002/ecjb.10182
DO - 10.1002/ecjb.10182
M3 - Article
VL - 86
SP - 64
EP - 75
JO - Electronics and Communications in Japan, Part II: Electronics (English translation of Denshi Tsushin Gakkai Ronbunshi)
T2 - Electronics and Communications in Japan, Part II: Electronics (English translation of Denshi Tsushin Gakkai Ronbunshi)
JF - Electronics and Communications in Japan, Part II: Electronics (English translation of Denshi Tsushin Gakkai Ronbunshi)
SN - 8756-663X
IS - 9
ER -