Automatic Testing of Embedded Software Based on State-Transition Requirement Specifications

Tsuyoshi Nakajima, Yuzo Bessho, Hiroshi Yamanaka, Kazumi Hirota

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

This paper proposes an automatic testing method in which the testing data is constructed on the basis of state-transition specifications and the testing of real machines with embedded software is automatically performed. In automatic testing based on specifications, in general a test scenario with the same extent of abstraction as the specification is difficult to convert to testing data that can be used by the automatic tester. In the proposed testing method, the event action in the state-transition specification is related to the setting and referral of the memory value in the embedded debugger, which makes it possible to convert the test scenario to testing data and to perform the testing automatically. A CASE tool to support the proposed testing method is realized and its performance is evaluated. The effectiveness and the problems of the proposed testing method are noted.

Original languageEnglish
Pages (from-to)64-75
Number of pages12
JournalElectronics and Communications in Japan, Part II: Electronics (English translation of Denshi Tsushin Gakkai Ronbunshi)
Volume86
Issue number9
DOIs
Publication statusPublished - 2003 Sep
Externally publishedYes

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Keywords

  • Automatic testing
  • Embedded software
  • State-transition specification
  • Testing data generation

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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