Back-illuminated GaN metal-semiconductor-metal UV photodetector with high internal gain

Hao Jiang; Naoyuki Nakata; Guang Yuan Zhao; Hiroyasu Ishikawa; Chun Lin Shao; Takashi Egawa; Takashi Jimbo; Masayoshi Umeno

doi:10.1143/jjap.40.l505

Back-illuminated GaN metal-semiconductor-metal UV photodetector with high internal gain

Hao Jiang, Naoyuki Nakata, Guang Yuan Zhao, Hiroyasu Ishikawa, Chun Lin Shao, Takashi Egawa, Takashi Jimbo, Masayoshi Umeno

Research output: Contribution to journal › Article › peer-review

43 Citations (Scopus)

Abstract

Back illuminated metal-semiconductor-metal photodetectors based on GaN grown on (0001) sapphire were fabricated and characterized. The photodetector with a thin GaN layer of 0.3 μm exhibited low dark current with a saturation value of 2.06 pA. A visible rejection of more than four orders of magnitude was observed in the spectral responsivity under 5 μW/cm² irradiance at 5 V bias. The responsivity was 16.5 A/W at a wavelength of 350 nm, which is 55 times that of the top illumination case. The results imply the presence of high internal gain under back illumination, due to the high density of charge generation.

Original language	English
Pages (from-to)	L505-L507
Journal	Japanese Journal of Applied Physics, Part 2: Letters
Volume	40
Issue number	5 B
DOIs	https://doi.org/10.1143/jjap.40.l505
Publication status	Published - 2001 May 15
Externally published	Yes

Keywords

Dark current
GaN
Internal gain
MSM-PD
Responsivity

ASJC Scopus subject areas

Engineering(all)
Physics and Astronomy(all)

Access to Document

10.1143/jjap.40.l505

Cite this

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title = "Back-illuminated GaN metal-semiconductor-metal UV photodetector with high internal gain",

abstract = "Back illuminated metal-semiconductor-metal photodetectors based on GaN grown on (0001) sapphire were fabricated and characterized. The photodetector with a thin GaN layer of 0.3 μm exhibited low dark current with a saturation value of 2.06 pA. A visible rejection of more than four orders of magnitude was observed in the spectral responsivity under 5 μW/cm2 irradiance at 5 V bias. The responsivity was 16.5 A/W at a wavelength of 350 nm, which is 55 times that of the top illumination case. The results imply the presence of high internal gain under back illumination, due to the high density of charge generation.",

keywords = "Dark current, GaN, Internal gain, MSM-PD, Responsivity",

author = "Hao Jiang and Naoyuki Nakata and Zhao, {Guang Yuan} and Hiroyasu Ishikawa and Shao, {Chun Lin} and Takashi Egawa and Takashi Jimbo and Masayoshi Umeno",

year = "2001",

month = may,

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doi = "10.1143/jjap.40.l505",

language = "English",

volume = "40",

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publisher = "Japan Society of Applied Physics",

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TY - JOUR

T1 - Back-illuminated GaN metal-semiconductor-metal UV photodetector with high internal gain

AU - Jiang, Hao

AU - Nakata, Naoyuki

AU - Zhao, Guang Yuan

AU - Ishikawa, Hiroyasu

AU - Shao, Chun Lin

AU - Egawa, Takashi

AU - Jimbo, Takashi

AU - Umeno, Masayoshi

PY - 2001/5/15

Y1 - 2001/5/15

N2 - Back illuminated metal-semiconductor-metal photodetectors based on GaN grown on (0001) sapphire were fabricated and characterized. The photodetector with a thin GaN layer of 0.3 μm exhibited low dark current with a saturation value of 2.06 pA. A visible rejection of more than four orders of magnitude was observed in the spectral responsivity under 5 μW/cm2 irradiance at 5 V bias. The responsivity was 16.5 A/W at a wavelength of 350 nm, which is 55 times that of the top illumination case. The results imply the presence of high internal gain under back illumination, due to the high density of charge generation.

AB - Back illuminated metal-semiconductor-metal photodetectors based on GaN grown on (0001) sapphire were fabricated and characterized. The photodetector with a thin GaN layer of 0.3 μm exhibited low dark current with a saturation value of 2.06 pA. A visible rejection of more than four orders of magnitude was observed in the spectral responsivity under 5 μW/cm2 irradiance at 5 V bias. The responsivity was 16.5 A/W at a wavelength of 350 nm, which is 55 times that of the top illumination case. The results imply the presence of high internal gain under back illumination, due to the high density of charge generation.

KW - Dark current

KW - GaN

KW - Internal gain

KW - MSM-PD

KW - Responsivity

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JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

SN - 0021-4922

IS - 5 B

ER -

Back-illuminated GaN metal-semiconductor-metal UV photodetector with high internal gain

Abstract

Keywords

ASJC Scopus subject areas

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