Behavior of switching noise and electromagnetic radiation in relation to package properties and on-chip decoupling capacitance

Toshio Sudo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

15 Citations (Scopus)

Abstract

Simultaneous switching noise (SSN) and electromagnetic radiation were intensively examined experimentally by using different test LSIs and packages. Two types of test LSIs have been designed and fabricated in 0.25 um CMOS process. One was with on-chip decoupling capacitance (ODC), and the other was without ODC. Then, two types of packages; quad flat package (QFP) and chip scale package (CSP) were used for housing them. First, SSN and radiated emission for the combination of two types of chips and two types of packages were measured by exciting output circuit and core logic circuit independently. QFP with larger package inductance showed larger power/ground fluctuation than CSP. On the other hand, QFP showed smaller emission properties than CSP. It is because package inductance worked as a filtering component. For both packages, every harmonics was reduced for the core circuit operation due to ODC, while it has been found that only even-order harmonics were dramatically decreased for the output buffer circuit operation.

Original languageEnglish
Title of host publication17th International Zurich Symposium on Electromagnetic Compatibility, 2006
Pages568-573
Number of pages6
Volume2006
Publication statusPublished - 2006
Event17th International Zurich Symposium on Electromagnetic Compatibility, 2006 - Singapore
Duration: 2006 Feb 272006 Mar 3

Other

Other17th International Zurich Symposium on Electromagnetic Compatibility, 2006
CitySingapore
Period06/2/2706/3/3

Fingerprint

Chip scale packages
Electromagnetic waves
Capacitance
Inductance
Buffer circuits
Networks (circuits)
Logic circuits

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Sudo, T. (2006). Behavior of switching noise and electromagnetic radiation in relation to package properties and on-chip decoupling capacitance. In 17th International Zurich Symposium on Electromagnetic Compatibility, 2006 (Vol. 2006, pp. 568-573). [1629688]

Behavior of switching noise and electromagnetic radiation in relation to package properties and on-chip decoupling capacitance. / Sudo, Toshio.

17th International Zurich Symposium on Electromagnetic Compatibility, 2006. Vol. 2006 2006. p. 568-573 1629688.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Sudo, T 2006, Behavior of switching noise and electromagnetic radiation in relation to package properties and on-chip decoupling capacitance. in 17th International Zurich Symposium on Electromagnetic Compatibility, 2006. vol. 2006, 1629688, pp. 568-573, 17th International Zurich Symposium on Electromagnetic Compatibility, 2006, Singapore, 06/2/27.
Sudo T. Behavior of switching noise and electromagnetic radiation in relation to package properties and on-chip decoupling capacitance. In 17th International Zurich Symposium on Electromagnetic Compatibility, 2006. Vol. 2006. 2006. p. 568-573. 1629688
Sudo, Toshio. / Behavior of switching noise and electromagnetic radiation in relation to package properties and on-chip decoupling capacitance. 17th International Zurich Symposium on Electromagnetic Compatibility, 2006. Vol. 2006 2006. pp. 568-573
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