Bitter pattern study of flux distribution in the BSCCO (2212)

E. Yasuda, N. Chikumoto, Y. Nakayama, K. Kishio, T. Nagatomo, M. Murakami

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

Microstructures of flux lines (FL) in Bi2Sr2CaCu2O8 single crystals are observed by a high-resolution Bitter-decoration technique. Experiments were performed at low (4.2 K) and high (77 K) temperatures under a constant magnetic field of 20 G. We could observe the interaction between FL and defects of materials, such as growth steps and other planar crystal defects. FL near defects were remarkably different between low and high temperatures. We also found that planar crystal defects, which extended parallel to the a-axis, were only active at low temperatures.

Original languageEnglish
Pages (from-to)564-567
Number of pages4
JournalPhysica C: Superconductivity and its applications
Volume357-360
DOIs
Publication statusPublished - 2001 Aug

Keywords

  • BSCCO (2212)
  • Bitter decoration technique
  • Flux line lattice

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

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