Abstract
Microstructures of flux lines (FL) in Bi2Sr2CaCu2O8 single crystals are observed by a high-resolution Bitter-decoration technique. Experiments were performed at low (4.2 K) and high (77 K) temperatures under a constant magnetic field of 20 G. We could observe the interaction between FL and defects of materials, such as growth steps and other planar crystal defects. FL near defects were remarkably different between low and high temperatures. We also found that planar crystal defects, which extended parallel to the a-axis, were only active at low temperatures.
| Original language | English |
|---|---|
| Pages (from-to) | 564-567 |
| Number of pages | 4 |
| Journal | Physica C: Superconductivity and its applications |
| Volume | 357-360 |
| DOIs | |
| Publication status | Published - 2001 Aug |
Keywords
- BSCCO (2212)
- Bitter decoration technique
- Flux line lattice
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Energy Engineering and Power Technology
- Electrical and Electronic Engineering
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Yasuda, E., Chikumoto, N., Nakayama, Y., Kishio, K., Nagatomo, T., & Murakami, M. (2001). Bitter pattern study of flux distribution in the BSCCO (2212). Physica C: Superconductivity and its applications, 357-360, 564-567. https://doi.org/10.1016/S0921-4534(01)00309-4