Bitter pattern study of flux distribution in the BSCCO (2212)

E. Yasuda; N. Chikumoto; Y. Nakayama; K. Kishio; T. Nagatomo; M. Murakami

doi:10.1016/S0921-4534(01)00309-4

Bitter pattern study of flux distribution in the BSCCO (2212)

E. Yasuda, N. Chikumoto, Y. Nakayama, K. Kishio, T. Nagatomo, M. Murakami

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Abstract

Microstructures of flux lines (FL) in Bi₂Sr₂CaCu₂O₈ single crystals are observed by a high-resolution Bitter-decoration technique. Experiments were performed at low (4.2 K) and high (77 K) temperatures under a constant magnetic field of 20 G. We could observe the interaction between FL and defects of materials, such as growth steps and other planar crystal defects. FL near defects were remarkably different between low and high temperatures. We also found that planar crystal defects, which extended parallel to the a-axis, were only active at low temperatures.

Original language	English
Pages (from-to)	564-567
Number of pages	4
Journal	Physica C: Superconductivity and its applications
Volume	357-360
DOIs	https://doi.org/10.1016/S0921-4534(01)00309-4
Publication status	Published - 2001 Aug
Externally published	Yes

Keywords

BSCCO (2212)
Bitter decoration technique
Flux line lattice

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Energy Engineering and Power Technology
Electrical and Electronic Engineering

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10.1016/S0921-4534(01)00309-4

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title = "Bitter pattern study of flux distribution in the BSCCO (2212)",

abstract = "Microstructures of flux lines (FL) in Bi2Sr2CaCu2O8 single crystals are observed by a high-resolution Bitter-decoration technique. Experiments were performed at low (4.2 K) and high (77 K) temperatures under a constant magnetic field of 20 G. We could observe the interaction between FL and defects of materials, such as growth steps and other planar crystal defects. FL near defects were remarkably different between low and high temperatures. We also found that planar crystal defects, which extended parallel to the a-axis, were only active at low temperatures.",

keywords = "BSCCO (2212), Bitter decoration technique, Flux line lattice",

author = "E. Yasuda and N. Chikumoto and Y. Nakayama and K. Kishio and T. Nagatomo and M. Murakami",

year = "2001",

month = aug,

doi = "10.1016/S0921-4534(01)00309-4",

language = "English",

volume = "357-360",

pages = "564--567",

journal = "Physica C: Superconductivity and its Applications",

issn = "0921-4534",

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TY - JOUR

T1 - Bitter pattern study of flux distribution in the BSCCO (2212)

AU - Yasuda, E.

AU - Chikumoto, N.

AU - Nakayama, Y.

AU - Kishio, K.

AU - Nagatomo, T.

AU - Murakami, M.

PY - 2001/8

Y1 - 2001/8

N2 - Microstructures of flux lines (FL) in Bi2Sr2CaCu2O8 single crystals are observed by a high-resolution Bitter-decoration technique. Experiments were performed at low (4.2 K) and high (77 K) temperatures under a constant magnetic field of 20 G. We could observe the interaction between FL and defects of materials, such as growth steps and other planar crystal defects. FL near defects were remarkably different between low and high temperatures. We also found that planar crystal defects, which extended parallel to the a-axis, were only active at low temperatures.

AB - Microstructures of flux lines (FL) in Bi2Sr2CaCu2O8 single crystals are observed by a high-resolution Bitter-decoration technique. Experiments were performed at low (4.2 K) and high (77 K) temperatures under a constant magnetic field of 20 G. We could observe the interaction between FL and defects of materials, such as growth steps and other planar crystal defects. FL near defects were remarkably different between low and high temperatures. We also found that planar crystal defects, which extended parallel to the a-axis, were only active at low temperatures.

KW - BSCCO (2212)

KW - Bitter decoration technique

KW - Flux line lattice

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VL - 357-360

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EP - 567

JO - Physica C: Superconductivity and its Applications

JF - Physica C: Superconductivity and its Applications

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