Bitter pattern study of flux distributions in melt-processed YBCO

Eiji Yasuda, Noriko Chikumoto, Masato Murakami, Takao Nagatomo

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

A high-resolution Bitter decoration technique has been used to observe the microstructure of flux-line lattices in melt-processed YBa2Cu3Oy (YBCO). In particular, we studied both static and dynamic flux distributions at low (4-23 K) and high temperatures (68-69 K) after field-cooling in the presence of 150 G. We could observe the flux motion after a long deposition time. There were remarkable differences in the behaviour of the flux motion, depending on the temperature.

Original languageEnglish
Pages (from-to)785-788
Number of pages4
JournalSuperconductor Science and Technology
Volume13
Issue number6
DOIs
Publication statusPublished - 2000 Jun
Externally publishedYes

Fingerprint

Fluxes
Cooling
cooling
Temperature
microstructure
Microstructure
high resolution
temperature

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Physics and Astronomy (miscellaneous)
  • Condensed Matter Physics

Cite this

Bitter pattern study of flux distributions in melt-processed YBCO. / Yasuda, Eiji; Chikumoto, Noriko; Murakami, Masato; Nagatomo, Takao.

In: Superconductor Science and Technology, Vol. 13, No. 6, 06.2000, p. 785-788.

Research output: Contribution to journalArticle

Yasuda, Eiji ; Chikumoto, Noriko ; Murakami, Masato ; Nagatomo, Takao. / Bitter pattern study of flux distributions in melt-processed YBCO. In: Superconductor Science and Technology. 2000 ; Vol. 13, No. 6. pp. 785-788.
@article{f878eac627ed42a79a4cf0d1a90515ed,
title = "Bitter pattern study of flux distributions in melt-processed YBCO",
abstract = "A high-resolution Bitter decoration technique has been used to observe the microstructure of flux-line lattices in melt-processed YBa2Cu3Oy (YBCO). In particular, we studied both static and dynamic flux distributions at low (4-23 K) and high temperatures (68-69 K) after field-cooling in the presence of 150 G. We could observe the flux motion after a long deposition time. There were remarkable differences in the behaviour of the flux motion, depending on the temperature.",
author = "Eiji Yasuda and Noriko Chikumoto and Masato Murakami and Takao Nagatomo",
year = "2000",
month = "6",
doi = "10.1088/0953-2048/13/6/331",
language = "English",
volume = "13",
pages = "785--788",
journal = "Superconductor Science and Technology",
issn = "0953-2048",
publisher = "IOP Publishing Ltd.",
number = "6",

}

TY - JOUR

T1 - Bitter pattern study of flux distributions in melt-processed YBCO

AU - Yasuda, Eiji

AU - Chikumoto, Noriko

AU - Murakami, Masato

AU - Nagatomo, Takao

PY - 2000/6

Y1 - 2000/6

N2 - A high-resolution Bitter decoration technique has been used to observe the microstructure of flux-line lattices in melt-processed YBa2Cu3Oy (YBCO). In particular, we studied both static and dynamic flux distributions at low (4-23 K) and high temperatures (68-69 K) after field-cooling in the presence of 150 G. We could observe the flux motion after a long deposition time. There were remarkable differences in the behaviour of the flux motion, depending on the temperature.

AB - A high-resolution Bitter decoration technique has been used to observe the microstructure of flux-line lattices in melt-processed YBa2Cu3Oy (YBCO). In particular, we studied both static and dynamic flux distributions at low (4-23 K) and high temperatures (68-69 K) after field-cooling in the presence of 150 G. We could observe the flux motion after a long deposition time. There were remarkable differences in the behaviour of the flux motion, depending on the temperature.

UR - http://www.scopus.com/inward/record.url?scp=0033688293&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0033688293&partnerID=8YFLogxK

U2 - 10.1088/0953-2048/13/6/331

DO - 10.1088/0953-2048/13/6/331

M3 - Article

VL - 13

SP - 785

EP - 788

JO - Superconductor Science and Technology

JF - Superconductor Science and Technology

SN - 0953-2048

IS - 6

ER -