Fingerprint
Dive into the research topics of 'Characterization of Current-Induced Degradation in Be-Doped HBT's Based in GaAs and InP'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Characterization of Current-Induced Degradation in Be-Doped HBT's Based in GaAs and InP
Shin Ichi Tanaka, Hidenori Shimawaki, Kensuke Kasahara, Kazuhiko Honjo
Research output: Contribution to journal › Article › peer-review
31
Citations
(Scopus)