Characterization of electroplated, thick permalloy films

S. Getlawi, M. Theis, S. Friedrich, A. Koblischka-Veneva, M. R. Koblischka, M. Saumer, U. Hartmann

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

Permalloy (Ni 18Fe 19) films and foils were fabricated by means of electroplating. Two different types of samples were produced, (i) a patterned permalloy film on a Si wafer (type 1) and (ii) a NiFe foil (type 2), which was separated from the substrate after deposition. The samples were characterized employing magnetic force microscopy (MFM), transmission electron microscopy (TEM) and electron-backscatter diffraction (EBSD). On the foil type sample, MFM reveals a maze domain pattern, and on the structured samples (type 1), a Landau domain pattern is obtained. EBSD enables the identification of the permalloy Kikuchi pattern without the effect of a substrate. The analysis reveals randomly oriented grains with a narrow size distribution.

Original languageEnglish
Pages (from-to)1809-1812
Number of pages4
JournalPhysica Status Solidi (A) Applications and Materials Science
Volume205
Issue number8
DOIs
Publication statusPublished - 2008 Aug 1

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Electrical and Electronic Engineering
  • Materials Chemistry

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