Characterization of ion-implanted silica glass by vacuum  ultraviolet absorption spectroscopy

M. Hattori, Y. Nishihara, Y. Ohki, M. Fujimaki, T. Souno, H. Nishikawa, T. Yamaguchi, E. Watanabe, M. Oikawa, T. Kamiya, K. Arakawa

Research output: Contribution to journalArticle

Original languageEnglish
JournalRadiation Effects in Insulators, Paper No. P-H.3 (Lisbon, Portugal)
Publication statusPublished - 2001 Sep 3

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Hattori, M., Nishihara, Y., Ohki, Y., Fujimaki, M., Souno, T., Nishikawa, H., Yamaguchi, T., Watanabe, E., Oikawa, M., Kamiya, T., & Arakawa, K. (2001). Characterization of ion-implanted silica glass by vacuum  ultraviolet absorption spectroscopy. Radiation Effects in Insulators, Paper No. P-H.3 (Lisbon, Portugal).