This paper presents experimental results of two types of test chips that were with and without on-chip capacitance. Radiated emission and simultaneous switching were characterized by activating I/O circuits or core logic circuits.
|Number of pages||4|
|Publication status||Published - 2001 Dec 1|
|Event||IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging - Cambridge, MA, United States|
Duration: 2001 Oct 29 → 2001 Oct 31
|Conference||IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging|
|Period||01/10/29 → 01/10/31|
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