Characterization of on-chip capacitance effects for I/O circuits and core circuits

Toshio Sudo; Ken Nakano; Junichi Kudo; Satoru Haga

Characterization of on-chip capacitance effects for I/O circuits and core circuits

Toshio Sudo, Ken Nakano, Junichi Kudo, Satoru Haga

Electrical Engineering and Computer Science

Research output: Contribution to conference › Paper › peer-review

9 Citations (Scopus)

Abstract

This paper presents experimental results of two types of test chips that were with and without on-chip capacitance. Radiated emission and simultaneous switching were characterized by activating I/O circuits or core logic circuits.

Original language	English
Pages	73-76
Number of pages	4
Publication status	Published - 2001 Dec 1
Event	IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging - Cambridge, MA, United States Duration: 2001 Oct 29 → 2001 Oct 31

Conference

Conference	IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging
Country/Territory	United States
City	Cambridge, MA
Period	01/10/29 → 01/10/31

ASJC Scopus subject areas

Engineering(all)

Cite this

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title = "Characterization of on-chip capacitance effects for I/O circuits and core circuits",

abstract = "This paper presents experimental results of two types of test chips that were with and without on-chip capacitance. Radiated emission and simultaneous switching were characterized by activating I/O circuits or core logic circuits.",

author = "Toshio Sudo and Ken Nakano and Junichi Kudo and Satoru Haga",

year = "2001",

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pages = "73--76",

note = "IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging ; Conference date: 29-10-2001 Through 31-10-2001",

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TY - CONF

T1 - Characterization of on-chip capacitance effects for I/O circuits and core circuits

AU - Sudo, Toshio

AU - Nakano, Ken

AU - Kudo, Junichi

AU - Haga, Satoru

PY - 2001/12/1

Y1 - 2001/12/1

N2 - This paper presents experimental results of two types of test chips that were with and without on-chip capacitance. Radiated emission and simultaneous switching were characterized by activating I/O circuits or core logic circuits.

AB - This paper presents experimental results of two types of test chips that were with and without on-chip capacitance. Radiated emission and simultaneous switching were characterized by activating I/O circuits or core logic circuits.

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M3 - Paper

AN - SCOPUS:0035699324

SP - 73

EP - 76

T2 - IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging

Y2 - 29 October 2001 through 31 October 2001

ER -

Characterization of on-chip capacitance effects for I/O circuits and core circuits

Abstract

Conference

ASJC Scopus subject areas

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