Characterization of on-chip capacitance effects for I/O circuits and core circuits

Toshio Sudo, Ken Nakano, Junichi Kudo, Satoru Haga

Research output: Contribution to conferencePaper

9 Citations (Scopus)

Abstract

This paper presents experimental results of two types of test chips that were with and without on-chip capacitance. Radiated emission and simultaneous switching were characterized by activating I/O circuits or core logic circuits.

Original languageEnglish
Pages73-76
Number of pages4
Publication statusPublished - 2001 Dec 1
EventIEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging - Cambridge, MA, United States
Duration: 2001 Oct 292001 Oct 31

Conference

ConferenceIEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging
CountryUnited States
CityCambridge, MA
Period01/10/2901/10/31

ASJC Scopus subject areas

  • Engineering(all)

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  • Cite this

    Sudo, T., Nakano, K., Kudo, J., & Haga, S. (2001). Characterization of on-chip capacitance effects for I/O circuits and core circuits. 73-76. Paper presented at IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging, Cambridge, MA, United States.