Characterization of on-chip capacitance effects for I/O circuits and core circuits

Toshio Sudo, Ken Nakano, Junichi Kudo, Satoru Haga

Research output: Chapter in Book/Report/Conference proceedingConference contribution

9 Citations (Scopus)

Abstract

This paper presents experimental results of two types of test chips that were with and without on-chip capacitance. Radiated emission and simultaneous switching were characterized by activating I/O circuits or core logic circuits.

Original languageEnglish
Title of host publicationIEEE Topical Meeting on Electrical Performance of Electronic Packaging
Pages73-76
Number of pages4
Publication statusPublished - 2001
EventIEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging - Cambridge, MA
Duration: 2001 Oct 292001 Oct 31

Other

OtherIEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging
CityCambridge, MA
Period01/10/2901/10/31

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ASJC Scopus subject areas

  • Engineering(all)

Cite this

Sudo, T., Nakano, K., Kudo, J., & Haga, S. (2001). Characterization of on-chip capacitance effects for I/O circuits and core circuits. In IEEE Topical Meeting on Electrical Performance of Electronic Packaging (pp. 73-76)