Characterization of refractive index changes of silica glass induced by ion microbeam

M. Hattori, Y. Ohki, M. Fujimaki, T. Souno, Hiroyuki Nishikawa, E. Watanabe, M. Oikawa, T. Kamiya, K. Arakawa

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

Distributions of structural and refractive index changes of silica irradiated by H+ microbeam were studied by optical and atomic force microscopes (AFM). The AFM measurements on the microbeam irradiated area show the formation of a groove on the surface. In addition, a cross sectional observation on the surface parallel to the incident plane reveals surface deformation along the ion tracks, which is deepest at the projected range of ions. Taking into account the possible structural changes of silica induced by energy deposition calculated by TRIM, the measured topological changes at the front and side surfaces result from internal compaction of silica glass. Refractive index changes were estimated from the Lorentz-Lorenz relationship using the distribution of the internal compaction estimated by the AFM measurements.

Original languageEnglish
Pages (from-to)272-276
Number of pages5
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume210
DOIs
Publication statusPublished - 2003 Sep

Fingerprint

microbeams
silica glass
Fused silica
Refractive index
Ions
refractivity
Microscopes
microscopes
Silicon Dioxide
ions
Compaction
Silica
silicon dioxide
grooves
energy

Keywords

  • Atomic force microscope
  • Compaction
  • Ion microbeam
  • Refractive index change
  • Silica glass

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Instrumentation
  • Surfaces and Interfaces

Cite this

Characterization of refractive index changes of silica glass induced by ion microbeam. / Hattori, M.; Ohki, Y.; Fujimaki, M.; Souno, T.; Nishikawa, Hiroyuki; Watanabe, E.; Oikawa, M.; Kamiya, T.; Arakawa, K.

In: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Vol. 210, 09.2003, p. 272-276.

Research output: Contribution to journalArticle

Hattori, M. ; Ohki, Y. ; Fujimaki, M. ; Souno, T. ; Nishikawa, Hiroyuki ; Watanabe, E. ; Oikawa, M. ; Kamiya, T. ; Arakawa, K. / Characterization of refractive index changes of silica glass induced by ion microbeam. In: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms. 2003 ; Vol. 210. pp. 272-276.
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