Comparison of the critical current density of YBCO films obtained by dc sputtering and pulsed laser deposition

I. Ivan, L. Miu, S. Popa, D. Miu, Paolo Mele, K. Matsumoto

Research output: Contribution to journalArticle

Abstract

We measured the critical current density Jc of optimally doped YBa2Cu3O7-δ thin films obtained by dc sputtering on (100) oriented SrTiO3 substrates and by pulsed laser deposition (PLD) on (100) oriented MgO substrates with SrTiO3 buffers. Jc at various temperatures T was determined from the magnetization curves registered with a vibrating sample magnetometer for an external magnetic field H (oriented along the c axis) up to 90 kOe. It was found that Jc of the films obtained by PLD usually overcomes the Jc values of the sputtered films in the whole investigated (H, T) domain.

Original languageEnglish
Pages (from-to)1234-1245
Number of pages12
JournalOptoelectronics and Advanced Materials, Rapid Communications
Volume4
Issue number8
Publication statusPublished - 2010 Aug 12
Externally publishedYes

Fingerprint

Pulsed laser deposition
Sputtering
Magnetometers
Substrates
Magnetization
Buffers
Magnetic fields
Thin films
Temperature
strontium titanium oxide
barium copper yttrium oxide

Keywords

  • Critical current density
  • DC sputtering
  • Magnetization curves
  • Pulsed laser deposition

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Cite this

Comparison of the critical current density of YBCO films obtained by dc sputtering and pulsed laser deposition. / Ivan, I.; Miu, L.; Popa, S.; Miu, D.; Mele, Paolo; Matsumoto, K.

In: Optoelectronics and Advanced Materials, Rapid Communications, Vol. 4, No. 8, 12.08.2010, p. 1234-1245.

Research output: Contribution to journalArticle

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AU - Miu, L.

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AU - Miu, D.

AU - Mele, Paolo

AU - Matsumoto, K.

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