Computer simulation of the surfactant epitaxy by Modified Embedded Atom Method (MEAM)

K. Mae, Kentaro Kyuno, R. Yamamoto

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

We have systematically performed the static calculations using the Modified Embedded Atom Method (MEAM). We have calculated the energetical difference between the structure with a monolayer film on a substrate and the structure with the film buried into the second layer. The calculation will give the necessary condition for the surfactant epitaxy and the substrate atom segregating phenomenon from the energetical point of view.

Original languageEnglish
Pages (from-to)225-230
Number of pages6
JournalComputational Materials Science
Volume6
Issue number3
DOIs
Publication statusPublished - 1996 Oct
Externally publishedYes

Fingerprint

embedded atom method
Epitaxial growth
Surface-Active Agents
epitaxy
Surface active agents
computerized simulation
surfactants
Atoms
Computer simulation
Substrates
Monolayers
atoms

ASJC Scopus subject areas

  • Materials Science(all)

Cite this

Computer simulation of the surfactant epitaxy by Modified Embedded Atom Method (MEAM). / Mae, K.; Kyuno, Kentaro; Yamamoto, R.

In: Computational Materials Science, Vol. 6, No. 3, 10.1996, p. 225-230.

Research output: Contribution to journalArticle

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