Contact resistance characteristics of high temperature superconducting bulk- Part IV

Hiroyuki Fujita, Takuya Imaizumi, Masaru Tomita, Naomichi Sakai, Masato Murakami, Izumi Hirabayashi, Koichiro Sawa

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Citations (Scopus)

Abstract

The authors have measured contact resistances between two bulk YBCO superconductor blocks for the application to a persistent current switch (PCS). In order to reduce a contact resistance, we deposited indium and silver on the sample surfaces. The resistance was reduced by increasing the thickness of the deposited metal layers, but it saturated when the thickness reached a certain level. The saturation thickness was much smaller in indium than silver. Such a difference is understandable by considering the hardness of these two metals. The resistance was also reduced by increasing the mechanical load. Overloading however caused the adhesion of metal layers, resulting in the peeling off of the deposited layers when the switch was opened. Additionally, the contact area of the switch was analyzed with finite element method (FEM). This analysis result may lead to the elucidation of a contact mechanism with the contact surfaces deposited metal.

Original languageEnglish
Title of host publicationElectrical Contacts, Proceedings of the Annual Holm Conference on Electrical Contacts
Pages272-276
Number of pages5
Volume2005
DOIs
Publication statusPublished - 2005
EventFifty-First IEEE Holm Conference on Electrical Contacts - Chicago, IL
Duration: 2005 Sep 262005 Sep 28

Other

OtherFifty-First IEEE Holm Conference on Electrical Contacts
CityChicago, IL
Period05/9/2605/9/28

Fingerprint

Contact resistance
Switches
Metals
Indium
Silver
Temperature
Peeling
Superconducting materials
Adhesion
Hardness
Finite element method

Keywords

  • Contact resistance
  • Deformation Analysis
  • Deposition
  • High-Temperature superconductor
  • Persistent current switch

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Fujita, H., Imaizumi, T., Tomita, M., Sakai, N., Murakami, M., Hirabayashi, I., & Sawa, K. (2005). Contact resistance characteristics of high temperature superconducting bulk- Part IV. In Electrical Contacts, Proceedings of the Annual Holm Conference on Electrical Contacts (Vol. 2005, pp. 272-276). [1518256] https://doi.org/10.1109/HOLM.2005.1518256

Contact resistance characteristics of high temperature superconducting bulk- Part IV. / Fujita, Hiroyuki; Imaizumi, Takuya; Tomita, Masaru; Sakai, Naomichi; Murakami, Masato; Hirabayashi, Izumi; Sawa, Koichiro.

Electrical Contacts, Proceedings of the Annual Holm Conference on Electrical Contacts. Vol. 2005 2005. p. 272-276 1518256.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Fujita, H, Imaizumi, T, Tomita, M, Sakai, N, Murakami, M, Hirabayashi, I & Sawa, K 2005, Contact resistance characteristics of high temperature superconducting bulk- Part IV. in Electrical Contacts, Proceedings of the Annual Holm Conference on Electrical Contacts. vol. 2005, 1518256, pp. 272-276, Fifty-First IEEE Holm Conference on Electrical Contacts, Chicago, IL, 05/9/26. https://doi.org/10.1109/HOLM.2005.1518256
Fujita H, Imaizumi T, Tomita M, Sakai N, Murakami M, Hirabayashi I et al. Contact resistance characteristics of high temperature superconducting bulk- Part IV. In Electrical Contacts, Proceedings of the Annual Holm Conference on Electrical Contacts. Vol. 2005. 2005. p. 272-276. 1518256 https://doi.org/10.1109/HOLM.2005.1518256
Fujita, Hiroyuki ; Imaizumi, Takuya ; Tomita, Masaru ; Sakai, Naomichi ; Murakami, Masato ; Hirabayashi, Izumi ; Sawa, Koichiro. / Contact resistance characteristics of high temperature superconducting bulk- Part IV. Electrical Contacts, Proceedings of the Annual Holm Conference on Electrical Contacts. Vol. 2005 2005. pp. 272-276
@inproceedings{bfdefd7638c14f53824f554078e68324,
title = "Contact resistance characteristics of high temperature superconducting bulk- Part IV",
abstract = "The authors have measured contact resistances between two bulk YBCO superconductor blocks for the application to a persistent current switch (PCS). In order to reduce a contact resistance, we deposited indium and silver on the sample surfaces. The resistance was reduced by increasing the thickness of the deposited metal layers, but it saturated when the thickness reached a certain level. The saturation thickness was much smaller in indium than silver. Such a difference is understandable by considering the hardness of these two metals. The resistance was also reduced by increasing the mechanical load. Overloading however caused the adhesion of metal layers, resulting in the peeling off of the deposited layers when the switch was opened. Additionally, the contact area of the switch was analyzed with finite element method (FEM). This analysis result may lead to the elucidation of a contact mechanism with the contact surfaces deposited metal.",
keywords = "Contact resistance, Deformation Analysis, Deposition, High-Temperature superconductor, Persistent current switch",
author = "Hiroyuki Fujita and Takuya Imaizumi and Masaru Tomita and Naomichi Sakai and Masato Murakami and Izumi Hirabayashi and Koichiro Sawa",
year = "2005",
doi = "10.1109/HOLM.2005.1518256",
language = "English",
isbn = "0780391136",
volume = "2005",
pages = "272--276",
booktitle = "Electrical Contacts, Proceedings of the Annual Holm Conference on Electrical Contacts",

}

TY - GEN

T1 - Contact resistance characteristics of high temperature superconducting bulk- Part IV

AU - Fujita, Hiroyuki

AU - Imaizumi, Takuya

AU - Tomita, Masaru

AU - Sakai, Naomichi

AU - Murakami, Masato

AU - Hirabayashi, Izumi

AU - Sawa, Koichiro

PY - 2005

Y1 - 2005

N2 - The authors have measured contact resistances between two bulk YBCO superconductor blocks for the application to a persistent current switch (PCS). In order to reduce a contact resistance, we deposited indium and silver on the sample surfaces. The resistance was reduced by increasing the thickness of the deposited metal layers, but it saturated when the thickness reached a certain level. The saturation thickness was much smaller in indium than silver. Such a difference is understandable by considering the hardness of these two metals. The resistance was also reduced by increasing the mechanical load. Overloading however caused the adhesion of metal layers, resulting in the peeling off of the deposited layers when the switch was opened. Additionally, the contact area of the switch was analyzed with finite element method (FEM). This analysis result may lead to the elucidation of a contact mechanism with the contact surfaces deposited metal.

AB - The authors have measured contact resistances between two bulk YBCO superconductor blocks for the application to a persistent current switch (PCS). In order to reduce a contact resistance, we deposited indium and silver on the sample surfaces. The resistance was reduced by increasing the thickness of the deposited metal layers, but it saturated when the thickness reached a certain level. The saturation thickness was much smaller in indium than silver. Such a difference is understandable by considering the hardness of these two metals. The resistance was also reduced by increasing the mechanical load. Overloading however caused the adhesion of metal layers, resulting in the peeling off of the deposited layers when the switch was opened. Additionally, the contact area of the switch was analyzed with finite element method (FEM). This analysis result may lead to the elucidation of a contact mechanism with the contact surfaces deposited metal.

KW - Contact resistance

KW - Deformation Analysis

KW - Deposition

KW - High-Temperature superconductor

KW - Persistent current switch

UR - http://www.scopus.com/inward/record.url?scp=33747432655&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33747432655&partnerID=8YFLogxK

U2 - 10.1109/HOLM.2005.1518256

DO - 10.1109/HOLM.2005.1518256

M3 - Conference contribution

AN - SCOPUS:33747432655

SN - 0780391136

SN - 9780780391130

VL - 2005

SP - 272

EP - 276

BT - Electrical Contacts, Proceedings of the Annual Holm Conference on Electrical Contacts

ER -