Correlation of measurement and simulation for simultaneous switching noise of FPGA

Yo Takahashi, Yuki Yamamoto, Toshio Sudo, Kunio Ota, Kazuhisa Matsuge

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

FPGAs (Field Programmable Gate Array) are now widely used for prototyping systems as well as mid-volume products. These FPGAs are fabricated by the leading edge CMOS process technology. These may excite false logic transition due to simultaneous switching CMOS output buffers [1]-[4]. In this paper, simultaneous switching noise of FPGA was investigated by both measurement and simulation. First, a precise circuit model was established by extracting the leadframe inductance of the package and including on-chip decoupling capacitance. The power supply impedance of an evaluation board was also simulated. Then, measured waveforms were compared with time-domain simulated results. The simulated time-domain waveforms showed a good agreement with measured waveforms. Moreover, ringing frequency of the measured waveforms was well correlated with the peak of the power supply impedance.

Original languageEnglish
Title of host publication2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010
Pages350-353
Number of pages4
DOIs
Publication statusPublished - 2010 Aug 2
Event2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010 - Beijing, China
Duration: 2010 Apr 122010 Apr 16

Publication series

Name2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010

Conference

Conference2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010
CountryChina
CityBeijing
Period10/4/1210/4/16

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ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Takahashi, Y., Yamamoto, Y., Sudo, T., Ota, K., & Matsuge, K. (2010). Correlation of measurement and simulation for simultaneous switching noise of FPGA. In 2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010 (pp. 350-353). [5475591] (2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010). https://doi.org/10.1109/APEMC.2010.5475591