Correlation of measurement and simulation for simultaneous switching noise of FPGA

Yo Takahashi, Yuki Yamamoto, Toshio Sudo, Kunio Ota, Kazuhisa Matsuge

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

FPGAs (Field Programmable Gate Array) are now widely used for prototyping systems as well as mid-volume products. These FPGAs are fabricated by the leading edge CMOS process technology. These may excite false logic transition due to simultaneous switching CMOS output buffers [1]-[4]. In this paper, simultaneous switching noise of FPGA was investigated by both measurement and simulation. First, a precise circuit model was established by extracting the leadframe inductance of the package and including on-chip decoupling capacitance. The power supply impedance of an evaluation board was also simulated. Then, measured waveforms were compared with time-domain simulated results. The simulated time-domain waveforms showed a good agreement with measured waveforms. Moreover, ringing frequency of the measured waveforms was well correlated with the peak of the power supply impedance.

Original languageEnglish
Title of host publication2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010
Pages350-353
Number of pages4
DOIs
Publication statusPublished - 2010
Event2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010 - Beijing
Duration: 2010 Apr 122010 Apr 16

Other

Other2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010
CityBeijing
Period10/4/1210/4/16

Fingerprint

Field programmable gate arrays (FPGA)
Inductance
Capacitance
Networks (circuits)

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Takahashi, Y., Yamamoto, Y., Sudo, T., Ota, K., & Matsuge, K. (2010). Correlation of measurement and simulation for simultaneous switching noise of FPGA. In 2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010 (pp. 350-353). [5475591] https://doi.org/10.1109/APEMC.2010.5475591

Correlation of measurement and simulation for simultaneous switching noise of FPGA. / Takahashi, Yo; Yamamoto, Yuki; Sudo, Toshio; Ota, Kunio; Matsuge, Kazuhisa.

2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010. 2010. p. 350-353 5475591.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Takahashi, Y, Yamamoto, Y, Sudo, T, Ota, K & Matsuge, K 2010, Correlation of measurement and simulation for simultaneous switching noise of FPGA. in 2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010., 5475591, pp. 350-353, 2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010, Beijing, 10/4/12. https://doi.org/10.1109/APEMC.2010.5475591
Takahashi Y, Yamamoto Y, Sudo T, Ota K, Matsuge K. Correlation of measurement and simulation for simultaneous switching noise of FPGA. In 2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010. 2010. p. 350-353. 5475591 https://doi.org/10.1109/APEMC.2010.5475591
Takahashi, Yo ; Yamamoto, Yuki ; Sudo, Toshio ; Ota, Kunio ; Matsuge, Kazuhisa. / Correlation of measurement and simulation for simultaneous switching noise of FPGA. 2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010. 2010. pp. 350-353
@inproceedings{d82e09280dba4079b876861560faa0dc,
title = "Correlation of measurement and simulation for simultaneous switching noise of FPGA",
abstract = "FPGAs (Field Programmable Gate Array) are now widely used for prototyping systems as well as mid-volume products. These FPGAs are fabricated by the leading edge CMOS process technology. These may excite false logic transition due to simultaneous switching CMOS output buffers [1]-[4]. In this paper, simultaneous switching noise of FPGA was investigated by both measurement and simulation. First, a precise circuit model was established by extracting the leadframe inductance of the package and including on-chip decoupling capacitance. The power supply impedance of an evaluation board was also simulated. Then, measured waveforms were compared with time-domain simulated results. The simulated time-domain waveforms showed a good agreement with measured waveforms. Moreover, ringing frequency of the measured waveforms was well correlated with the peak of the power supply impedance.",
author = "Yo Takahashi and Yuki Yamamoto and Toshio Sudo and Kunio Ota and Kazuhisa Matsuge",
year = "2010",
doi = "10.1109/APEMC.2010.5475591",
language = "English",
isbn = "9781424456215",
pages = "350--353",
booktitle = "2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010",

}

TY - GEN

T1 - Correlation of measurement and simulation for simultaneous switching noise of FPGA

AU - Takahashi, Yo

AU - Yamamoto, Yuki

AU - Sudo, Toshio

AU - Ota, Kunio

AU - Matsuge, Kazuhisa

PY - 2010

Y1 - 2010

N2 - FPGAs (Field Programmable Gate Array) are now widely used for prototyping systems as well as mid-volume products. These FPGAs are fabricated by the leading edge CMOS process technology. These may excite false logic transition due to simultaneous switching CMOS output buffers [1]-[4]. In this paper, simultaneous switching noise of FPGA was investigated by both measurement and simulation. First, a precise circuit model was established by extracting the leadframe inductance of the package and including on-chip decoupling capacitance. The power supply impedance of an evaluation board was also simulated. Then, measured waveforms were compared with time-domain simulated results. The simulated time-domain waveforms showed a good agreement with measured waveforms. Moreover, ringing frequency of the measured waveforms was well correlated with the peak of the power supply impedance.

AB - FPGAs (Field Programmable Gate Array) are now widely used for prototyping systems as well as mid-volume products. These FPGAs are fabricated by the leading edge CMOS process technology. These may excite false logic transition due to simultaneous switching CMOS output buffers [1]-[4]. In this paper, simultaneous switching noise of FPGA was investigated by both measurement and simulation. First, a precise circuit model was established by extracting the leadframe inductance of the package and including on-chip decoupling capacitance. The power supply impedance of an evaluation board was also simulated. Then, measured waveforms were compared with time-domain simulated results. The simulated time-domain waveforms showed a good agreement with measured waveforms. Moreover, ringing frequency of the measured waveforms was well correlated with the peak of the power supply impedance.

UR - http://www.scopus.com/inward/record.url?scp=77954964167&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=77954964167&partnerID=8YFLogxK

U2 - 10.1109/APEMC.2010.5475591

DO - 10.1109/APEMC.2010.5475591

M3 - Conference contribution

AN - SCOPUS:77954964167

SN - 9781424456215

SP - 350

EP - 353

BT - 2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010

ER -