Abstract
Structural analyses and investigations of flux penetration of typically melt-textured YBa2Cu3O7-δ samples were performed. This allows regions of suppressed critical current density to be directly related to microstructural defects. At small-angle grain boundaries the critical current density was found to be reduced by a factor of up to 20.
Original language | English |
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Number of pages | 1 |
Journal | Applied Physics Letters |
DOIs | |
Publication status | Published - 1995 Jan 1 |
Externally published | Yes |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)