Critical current limiting structural defects in melt-textured YBa2Cu3O7-δ

R. Hedderich, Th Schuster, H. Kuhn, J. Geerk, G. Linker, M. Murakami

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Abstract

Structural analyses and investigations of flux penetration of typically melt-textured YBa2Cu3O7-δ samples were performed. This allows regions of suppressed critical current density to be directly related to microstructural defects. At small-angle grain boundaries the critical current density was found to be reduced by a factor of up to 20.

Original languageEnglish
Number of pages1
JournalApplied Physics Letters
DOIs
Publication statusPublished - 1995 Jan 1

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ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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