Critical current limiting structural defects in melt-textured YBa2Cu3O7-δ

R. Hedderich, Th Schuster, H. Kuhn, J. Geerk, G. Linker, M. Murakami

Research output: Contribution to journalArticlepeer-review

19 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Critical current limiting structural defects in melt-textured YBa2Cu3O7-δ'. Together they form a unique fingerprint.

Physics & Astronomy