Fingerprint Dive into the research topics of 'Critical current limiting structural defects in melt-textured YBa<sub>2</sub>Cu<sub>3</sub>O<sub>7-δ</sub>'. Together they form a unique fingerprint.
- Sort by
- Weight
- Alphabetically
Critical current limiting structural defects in melt-textured YBa2Cu3O7-δ
R. Hedderich, Th Schuster, H. Kuhn, J. Geerk, G. Linker, M. Murakami
Research output: Contribution to journal › Article › peer-review
17
Citations
(Scopus)