The crystallographic orientation of magnetite (Fe3 04) thin films was measured using electron backscatter diffraction (EBSD). Misori-entation boundaries appear in maps of angular misorientation data. The distribution of misorientation angles changes after annealing the samples in air at 250° C. Most small-angle misorientations (<5°) are removed after one minute of annealing, whereas larger misorientations (as high as 60°) continue to persist.
- Crystal growth
- electron backscatter diffraction
- electron microscopy
- position measurement
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering