Crystallographic Orientation Analyses of Magnetite Thin Films Using Electron Backscatter Diffraction (EBSD)

Anjela Dimitrova Koblischka-Veneva, F. Mücklich, Michael Rudolf Koblischka, S. Murphy, Y. Zhou, I. V. Shvets

Research output: Contribution to journalArticle

13 Citations (Scopus)

Abstract

The crystallographic orientation of magnetite (Fe3 04) thin films was measured using electron backscatter diffraction (EBSD). Misori-entation boundaries appear in maps of angular misorientation data. The distribution of misorientation angles changes after annealing the samples in air at 250° C. Most small-angle misorientations (<5°) are removed after one minute of annealing, whereas larger misorientations (as high as 60°) continue to persist.

Original languageEnglish
Pages (from-to)2873-2875
Number of pages3
JournalIEEE Transactions on Magnetics
Volume42
Issue number10
DOIs
Publication statusPublished - 2006 Jan 1
Externally publishedYes

Fingerprint

Ferrosoferric Oxide
Magnetite
Electron diffraction
Annealing
Thin films
Air

Keywords

  • Crystal growth
  • electron backscatter diffraction
  • electron microscopy
  • magnetite
  • position measurement

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Cite this

Crystallographic Orientation Analyses of Magnetite Thin Films Using Electron Backscatter Diffraction (EBSD). / Koblischka-Veneva, Anjela Dimitrova; Mücklich, F.; Koblischka, Michael Rudolf; Murphy, S.; Zhou, Y.; Shvets, I. V.

In: IEEE Transactions on Magnetics, Vol. 42, No. 10, 01.01.2006, p. 2873-2875.

Research output: Contribution to journalArticle

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