Crystallographic orientation analysis of magnetite thin films by means of electron backscatter diffraction (EBSD)

A. D. Koblischka-Veneva; M. R. Koblischka; F. Muecklich; S. Murphy; Y. Zhou; I. V. Shvets

doi:10.1109/INTMAG.2006.375455

Crystallographic orientation analysis of magnetite thin films by means of electron backscatter diffraction (EBSD)

A. D. Koblischka-Veneva, M. R. Koblischka, F. Muecklich, S. Murphy, Y. Zhou, I. V. Shvets

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	INTERMAG 2006 - IEEE International Magnetics Conference
Number of pages	1
DOIs	https://doi.org/10.1109/INTMAG.2006.375455
Publication status	Published - 2006 Dec 1
Externally published	Yes
Event	INTERMAG 2006 - IEEE International Magnetics Conference - San Diego, CA, United States Duration: 2006 May 8 → 2006 May 12

Publication series

Name	INTERMAG 2006 - IEEE International Magnetics Conference

Conference

Conference	INTERMAG 2006 - IEEE International Magnetics Conference
Country/Territory	United States
City	San Diego, CA
Period	06/5/8 → 06/5/12

ASJC Scopus subject areas

Electrical and Electronic Engineering
Electronic, Optical and Magnetic Materials

Access to Document

10.1109/INTMAG.2006.375455

Cite this

Koblischka-Veneva, A. D., Koblischka, M. R., Muecklich, F., Murphy, S., Zhou, Y., & Shvets, I. V. (2006). Crystallographic orientation analysis of magnetite thin films by means of electron backscatter diffraction (EBSD). In INTERMAG 2006 - IEEE International Magnetics Conference [4262422] (INTERMAG 2006 - IEEE International Magnetics Conference). https://doi.org/10.1109/INTMAG.2006.375455

Crystallographic orientation analysis of magnetite thin films by means of electron backscatter diffraction (EBSD). / Koblischka-Veneva, A. D.; Koblischka, M. R.; Muecklich, F. et al.

INTERMAG 2006 - IEEE International Magnetics Conference. 2006. 4262422 (INTERMAG 2006 - IEEE International Magnetics Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Koblischka-Veneva, AD, Koblischka, MR, Muecklich, F, Murphy, S, Zhou, Y & Shvets, IV 2006, Crystallographic orientation analysis of magnetite thin films by means of electron backscatter diffraction (EBSD). in INTERMAG 2006 - IEEE International Magnetics Conference., 4262422, INTERMAG 2006 - IEEE International Magnetics Conference, INTERMAG 2006 - IEEE International Magnetics Conference, San Diego, CA, United States, 06/5/8. https://doi.org/10.1109/INTMAG.2006.375455

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author = "Koblischka-Veneva, {A. D.} and Koblischka, {M. R.} and F. Muecklich and S. Murphy and Y. Zhou and Shvets, {I. V.}",

year = "2006",

month = dec,

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doi = "10.1109/INTMAG.2006.375455",

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AU - Koblischka-Veneva, A. D.

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AU - Murphy, S.

AU - Zhou, Y.

AU - Shvets, I. V.

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SN - 9781424414796

T3 - INTERMAG 2006 - IEEE International Magnetics Conference

BT - INTERMAG 2006 - IEEE International Magnetics Conference

T2 - INTERMAG 2006 - IEEE International Magnetics Conference

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ER -

Crystallographic orientation analysis of magnetite thin films by means of electron backscatter diffraction (EBSD)

Publication series

Conference

ASJC Scopus subject areas

Access to Document

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