Crystallographic orientation analysis of magnetite thin films by means of electron backscatter diffraction (EBSD)

Anjela Dimitrova Koblischka-Veneva, Michael Rudolf Koblischka, F. Muecklich, S. Murphy, Y. Zhou, I. V. Shvets

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationINTERMAG 2006 - IEEE International Magnetics Conference
Number of pages1
DOIs
Publication statusPublished - 2006 Dec 1
Externally publishedYes
EventINTERMAG 2006 - IEEE International Magnetics Conference - San Diego, CA
Duration: 2006 May 82006 May 12

Other

OtherINTERMAG 2006 - IEEE International Magnetics Conference
CitySan Diego, CA
Period06/5/806/5/12

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

Cite this

Koblischka-Veneva, A. D., Koblischka, M. R., Muecklich, F., Murphy, S., Zhou, Y., & Shvets, I. V. (2006). Crystallographic orientation analysis of magnetite thin films by means of electron backscatter diffraction (EBSD). In INTERMAG 2006 - IEEE International Magnetics Conference [4262422] https://doi.org/10.1109/INTMAG.2006.375455