Crystallographic orientation analysis of magnetite thin films by means of electron backscatter diffraction (EBSD)

Anjela Dimitrova Koblischka-Veneva, Michael Rudolf Koblischka, F. Muecklich, S. Murphy, Y. Zhou, I. V. Shvets

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationINTERMAG 2006 - IEEE International Magnetics Conference
Number of pages1
DOIs
Publication statusPublished - 2006 Dec 1
Externally publishedYes
EventINTERMAG 2006 - IEEE International Magnetics Conference - San Diego, CA
Duration: 2006 May 82006 May 12

Other

OtherINTERMAG 2006 - IEEE International Magnetics Conference
CitySan Diego, CA
Period06/5/806/5/12

Fingerprint

Magnetite
Electron diffraction
Thin films

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

Cite this

Koblischka-Veneva, A. D., Koblischka, M. R., Muecklich, F., Murphy, S., Zhou, Y., & Shvets, I. V. (2006). Crystallographic orientation analysis of magnetite thin films by means of electron backscatter diffraction (EBSD). In INTERMAG 2006 - IEEE International Magnetics Conference [4262422] https://doi.org/10.1109/INTMAG.2006.375455

Crystallographic orientation analysis of magnetite thin films by means of electron backscatter diffraction (EBSD). / Koblischka-Veneva, Anjela Dimitrova; Koblischka, Michael Rudolf; Muecklich, F.; Murphy, S.; Zhou, Y.; Shvets, I. V.

INTERMAG 2006 - IEEE International Magnetics Conference. 2006. 4262422.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Koblischka-Veneva, AD, Koblischka, MR, Muecklich, F, Murphy, S, Zhou, Y & Shvets, IV 2006, Crystallographic orientation analysis of magnetite thin films by means of electron backscatter diffraction (EBSD). in INTERMAG 2006 - IEEE International Magnetics Conference., 4262422, INTERMAG 2006 - IEEE International Magnetics Conference, San Diego, CA, 06/5/8. https://doi.org/10.1109/INTMAG.2006.375455
Koblischka-Veneva, Anjela Dimitrova ; Koblischka, Michael Rudolf ; Muecklich, F. ; Murphy, S. ; Zhou, Y. ; Shvets, I. V. / Crystallographic orientation analysis of magnetite thin films by means of electron backscatter diffraction (EBSD). INTERMAG 2006 - IEEE International Magnetics Conference. 2006.
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