Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope

P. Wang, A. I. Kirkland, P. D. Nellist, A. J. D’alfonso, A. J. Morgan, L. J. Allen, A. Hashimoto, M. Takeguchi, K. Mitsuishi, M. Shimojo

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)532-533
Number of pages2
JournalMicroscopy and Microanalysis
Volume18
Issue numberS2
DOIs
Publication statusPublished - 2012 Jul

ASJC Scopus subject areas

  • Instrumentation

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