Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope

P. Wang, A. I. Kirkland, P. D. Nellist, A. J. D’alfonso, A. J. Morgan, L. J. Allen, A. Hashimoto, M. Takeguchi, K. Mitsuishi, Masayuki Shimojo

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)532-533
Number of pages2
JournalMicroscopy and Microanalysis
Volume18
Issue numberS2
DOIs
Publication statusPublished - 2012

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Confocal microscopy
Aberrations
Electron microscopy
aberration
Electron microscopes
electron microscopes
Scanning
scanning electron microscopy

ASJC Scopus subject areas

  • Instrumentation

Cite this

Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope. / Wang, P.; Kirkland, A. I.; Nellist, P. D.; D’alfonso, A. J.; Morgan, A. J.; Allen, L. J.; Hashimoto, A.; Takeguchi, M.; Mitsuishi, K.; Shimojo, Masayuki.

In: Microscopy and Microanalysis, Vol. 18, No. S2, 2012, p. 532-533.

Research output: Contribution to journalArticle

Wang, P, Kirkland, AI, Nellist, PD, D’alfonso, AJ, Morgan, AJ, Allen, LJ, Hashimoto, A, Takeguchi, M, Mitsuishi, K & Shimojo, M 2012, 'Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope', Microscopy and Microanalysis, vol. 18, no. S2, pp. 532-533. https://doi.org/10.1017/S1431927612004515
Wang, P. ; Kirkland, A. I. ; Nellist, P. D. ; D’alfonso, A. J. ; Morgan, A. J. ; Allen, L. J. ; Hashimoto, A. ; Takeguchi, M. ; Mitsuishi, K. ; Shimojo, Masayuki. / Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope. In: Microscopy and Microanalysis. 2012 ; Vol. 18, No. S2. pp. 532-533.
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