Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope

P. Wang, A. I. Kirkland, P. D. Nellist, A. J. D’alfonso, A. J. Morgan, L. J. Allen, A. Hashimoto, M. Takeguchi, K. Mitsuishi, Masayuki Shimojo

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)532-533
Number of pages2
JournalMicroscopy and Microanalysis
Volume18
Issue numberS2
DOIs
Publication statusPublished - 2012

ASJC Scopus subject areas

  • Instrumentation

Cite this

Wang, P., Kirkland, A. I., Nellist, P. D., D’alfonso, A. J., Morgan, A. J., Allen, L. J., Hashimoto, A., Takeguchi, M., Mitsuishi, K., & Shimojo, M. (2012). Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope. Microscopy and Microanalysis, 18(S2), 532-533. https://doi.org/10.1017/S1431927612004515