Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope

P. Wang, A. I. Kirkland, P. D. Nellist, A. J. D’alfonso, A. J. Morgan, L. J. Allen, A. Hashimoto, M. Takeguchi, K. Mitsuishi, Masayuki Shimojo

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)532-533
Number of pages2
JournalMicroscopy and Microanalysis
Issue numberS2
Publication statusPublished - 2012

ASJC Scopus subject areas

  • Instrumentation

Cite this