Deconvolution method used in improving the depth resolution of three-dimensional images taken by scanning confocal electron microscopy

X. Zhang, M. Takeguchi, A. Hashimoto, K. Mitsuishi, M. Shimojo

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
JournalDefault journal
Publication statusPublished - 2010 Aug 1

Cite this