Original language | English |
---|---|
Journal | Default journal |
Publication status | Published - 2010 Aug 1 |
Deconvolution method used in improving the depth resolution of three-dimensional images taken by scanning confocal electron microscopy
X. Zhang, M. Takeguchi, A. Hashimoto, K. Mitsuishi, M. Shimojo
Research output: Contribution to journal › Article › peer-review