Deducing structural variations of the apex of probes used in near-field optical microscopy through simultaneous measurement of shear force and evanescent intensity

Rajagopalan Umamaheswari, S. Mononobe, M. Ohtsu

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

We propose a simple method employing the simultaneous detection of evanescent intensity and shear force to deduce variations in the near-field optical morphology of the apex of the probes used in near-field microscopy. Fabrication of our probes involves sharpening by chemical etching, metal coating, and removal of metal from the apex. We show that through the simultaneous measurement of shear force and evanescent intensity, it is possible to detect variations in the optical morphology of the very apex of the probes during near-field imaging by a scanning near-field optical microscope.

Original languageEnglish
Pages (from-to)6740-6743
Number of pages4
JournalApplied Optics
Volume35
Issue number34
DOIs
Publication statusPublished - 1996 Dec 1
Externally publishedYes

Fingerprint

Optical microscopy
near fields
apexes
shear
microscopy
probes
Metal coatings
metal coatings
Etching
Microscopic examination
Microscopes
optical microscopes
Scanning
Imaging techniques
Fabrication
etching
Metals
fabrication
scanning
metals

Keywords

  • Evanescent intensity
  • Near-field optical microscopy
  • Near-field optical morphology of probe
  • Shear force
  • Simultaneous detection

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

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abstract = "We propose a simple method employing the simultaneous detection of evanescent intensity and shear force to deduce variations in the near-field optical morphology of the apex of the probes used in near-field microscopy. Fabrication of our probes involves sharpening by chemical etching, metal coating, and removal of metal from the apex. We show that through the simultaneous measurement of shear force and evanescent intensity, it is possible to detect variations in the optical morphology of the very apex of the probes during near-field imaging by a scanning near-field optical microscope.",
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AU - Umamaheswari, Rajagopalan

AU - Mononobe, S.

AU - Ohtsu, M.

PY - 1996/12/1

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AB - We propose a simple method employing the simultaneous detection of evanescent intensity and shear force to deduce variations in the near-field optical morphology of the apex of the probes used in near-field microscopy. Fabrication of our probes involves sharpening by chemical etching, metal coating, and removal of metal from the apex. We show that through the simultaneous measurement of shear force and evanescent intensity, it is possible to detect variations in the optical morphology of the very apex of the probes during near-field imaging by a scanning near-field optical microscope.

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KW - Shear force

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