Deducing structural variations of the apex of probes used in near-field optical microscopy through simultaneous measurement of shear force and evanescent intensity

R. Uma Maheswari; S. Mononobe; M. Ohtsu

doi:10.1364/AO.35.006740

Deducing structural variations of the apex of probes used in near-field optical microscopy through simultaneous measurement of shear force and evanescent intensity

R. Uma Maheswari, S. Mononobe, M. Ohtsu

Research output: Contribution to journal › Article › peer-review

4 Citations (Scopus)

Abstract

We propose a simple method employing the simultaneous detection of evanescent intensity and shear force to deduce variations in the near-field optical morphology of the apex of the probes used in near-field microscopy. Fabrication of our probes involves sharpening by chemical etching, metal coating, and removal of metal from the apex. We show that through the simultaneous measurement of shear force and evanescent intensity, it is possible to detect variations in the optical morphology of the very apex of the probes during near-field imaging by a scanning near-field optical microscope.

Original language	English
Pages (from-to)	6740-6743
Number of pages	4
Journal	Applied Optics
Volume	35
Issue number	34
DOIs	https://doi.org/10.1364/AO.35.006740
Publication status	Published - 1996 Dec 1
Externally published	Yes

Keywords

Evanescent intensity
Near-field optical microscopy
Near-field optical morphology of probe
Shear force
Simultaneous detection

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics
Engineering (miscellaneous)
Electrical and Electronic Engineering

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abstract = "We propose a simple method employing the simultaneous detection of evanescent intensity and shear force to deduce variations in the near-field optical morphology of the apex of the probes used in near-field microscopy. Fabrication of our probes involves sharpening by chemical etching, metal coating, and removal of metal from the apex. We show that through the simultaneous measurement of shear force and evanescent intensity, it is possible to detect variations in the optical morphology of the very apex of the probes during near-field imaging by a scanning near-field optical microscope.",

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AU - Mononobe, S.

AU - Ohtsu, M.

PY - 1996/12/1

Y1 - 1996/12/1

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KW - Shear force

KW - Simultaneous detection

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