Abstract
We propose a simple method employing the simultaneous detection of evanescent intensity and shear force to deduce variations in the near-field optical morphology of the apex of the probes used in near-field microscopy. Fabrication of our probes involves sharpening by chemical etching, metal coating, and removal of metal from the apex. We show that through the simultaneous measurement of shear force and evanescent intensity, it is possible to detect variations in the optical morphology of the very apex of the probes during near-field imaging by a scanning near-field optical microscope.
| Original language | English |
|---|---|
| Pages (from-to) | 6740-6743 |
| Number of pages | 4 |
| Journal | Applied Optics |
| Volume | 35 |
| Issue number | 34 |
| DOIs | |
| Publication status | Published - 1996 Dec 1 |
| Externally published | Yes |
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Keywords
- Evanescent intensity
- Near-field optical microscopy
- Near-field optical morphology of probe
- Shear force
- Simultaneous detection
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics
Cite this
Deducing structural variations of the apex of probes used in near-field optical microscopy through simultaneous measurement of shear force and evanescent intensity. / Umamaheswari, Rajagopalan; Mononobe, S.; Ohtsu, M.
In: Applied Optics, Vol. 35, No. 34, 01.12.1996, p. 6740-6743.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Deducing structural variations of the apex of probes used in near-field optical microscopy through simultaneous measurement of shear force and evanescent intensity
AU - Umamaheswari, Rajagopalan
AU - Mononobe, S.
AU - Ohtsu, M.
PY - 1996/12/1
Y1 - 1996/12/1
N2 - We propose a simple method employing the simultaneous detection of evanescent intensity and shear force to deduce variations in the near-field optical morphology of the apex of the probes used in near-field microscopy. Fabrication of our probes involves sharpening by chemical etching, metal coating, and removal of metal from the apex. We show that through the simultaneous measurement of shear force and evanescent intensity, it is possible to detect variations in the optical morphology of the very apex of the probes during near-field imaging by a scanning near-field optical microscope.
AB - We propose a simple method employing the simultaneous detection of evanescent intensity and shear force to deduce variations in the near-field optical morphology of the apex of the probes used in near-field microscopy. Fabrication of our probes involves sharpening by chemical etching, metal coating, and removal of metal from the apex. We show that through the simultaneous measurement of shear force and evanescent intensity, it is possible to detect variations in the optical morphology of the very apex of the probes during near-field imaging by a scanning near-field optical microscope.
KW - Evanescent intensity
KW - Near-field optical microscopy
KW - Near-field optical morphology of probe
KW - Shear force
KW - Simultaneous detection
UR - http://www.scopus.com/inward/record.url?scp=6144220063&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=6144220063&partnerID=8YFLogxK
U2 - 10.1364/AO.35.006740
DO - 10.1364/AO.35.006740
M3 - Article
C2 - 21151256
AN - SCOPUS:6144220063
VL - 35
SP - 6740
EP - 6743
JO - Applied Optics
JF - Applied Optics
SN - 0003-6935
IS - 34
ER -