Defects and morphologies produced by keV ion bombardment of Ge and Si surfaces

D.G.Cahill D.G.Cahill, J.Kim J.Kim, K.Kyuno K.Kyuno, R.S.Averback R.S.Averback, Kentaro Kyuno

Research output: Contribution to journalArticle

Original languageEnglish
JournalMaterials Research Society
Publication statusPublished - 1999 Apr 1

Cite this

D.G.Cahill, D. G. C., J.Kim, J. K., K.Kyuno, K. K., R.S.Averback, R. S. A., & Kyuno, K. (1999). Defects and morphologies produced by keV ion bombardment of Ge and Si surfaces. Materials Research Society.

Defects and morphologies produced by keV ion bombardment of Ge and Si surfaces. / D.G.Cahill, D.G.Cahill; J.Kim, J.Kim; K.Kyuno, K.Kyuno; R.S.Averback, R.S.Averback; Kyuno, Kentaro.

In: Materials Research Society, 01.04.1999.

Research output: Contribution to journalArticle

D.G.Cahill, D.G.Cahill ; J.Kim, J.Kim ; K.Kyuno, K.Kyuno ; R.S.Averback, R.S.Averback ; Kyuno, Kentaro. / Defects and morphologies produced by keV ion bombardment of Ge and Si surfaces. In: Materials Research Society. 1999.
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