Design and evaluation of fine-grained power-gating for embedded microprocessors

Masaaki Kondo, Hiroaki Kobyashi, Ryuichi Sakamoto, Motoki Wada, Jun Tsukamoto, Mitaro Namiki, Weihan Wang, Hideharu Amano, Kensaku Matsunaga, Masaru Kudo, Kimiyoshi Usami, Toshiya Komoda, Hiroshi Nakamura

Research output: Chapter in Book/Report/Conference proceedingConference contribution

13 Citations (Scopus)

Abstract

Power-performance efficiency is still remaining a primary concern for microprocessor designers. One of the sources of power inefficiency for recent LSI chips is increasing leakage power consumption. Power-gating is a well known technique to reduce leakage power consumption by switching off the power supply to idle logic blocks. Recently, fine-grained power-gating is emerged as a technique to minimize leakage current during the active processor cycles by switching on and off a logic blocks in much finer temporal/spatial granularity. Though fine-grained power-gating is useful, a comprehensive evaluation and analysis has not been conducted on a real LSI chips. In this paper, we evaluate fine-grained run-time power-gating for microprocessors' functional units using a real embedded microprocessor. We also introduce an architecture and compiler co-operative power-gating scheme which mitigates negative power reduction caused by the energy overhead associated with finegrained power-gating. The experimental results with a fabricated core shows that a hardware-based scheme saves power consumption of functional units by 44% and hardware compiler co-operative scheme further improves power efficiency by 5.9% when core temperature is 25 ̊C.

Original languageEnglish
Title of host publicationProceedings -Design, Automation and Test in Europe, DATE
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9783981537024
DOIs
Publication statusPublished - 2014
Event17th Design, Automation and Test in Europe, DATE 2014 - Dresden
Duration: 2014 Mar 242014 Mar 28

Other

Other17th Design, Automation and Test in Europe, DATE 2014
CityDresden
Period14/3/2414/3/28

Fingerprint

Microprocessor chips
Electric power utilization
Hardware
Leakage currents
Temperature

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Kondo, M., Kobyashi, H., Sakamoto, R., Wada, M., Tsukamoto, J., Namiki, M., ... Nakamura, H. (2014). Design and evaluation of fine-grained power-gating for embedded microprocessors. In Proceedings -Design, Automation and Test in Europe, DATE [6800359] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.7873/DATE2014.158

Design and evaluation of fine-grained power-gating for embedded microprocessors. / Kondo, Masaaki; Kobyashi, Hiroaki; Sakamoto, Ryuichi; Wada, Motoki; Tsukamoto, Jun; Namiki, Mitaro; Wang, Weihan; Amano, Hideharu; Matsunaga, Kensaku; Kudo, Masaru; Usami, Kimiyoshi; Komoda, Toshiya; Nakamura, Hiroshi.

Proceedings -Design, Automation and Test in Europe, DATE. Institute of Electrical and Electronics Engineers Inc., 2014. 6800359.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Kondo, M, Kobyashi, H, Sakamoto, R, Wada, M, Tsukamoto, J, Namiki, M, Wang, W, Amano, H, Matsunaga, K, Kudo, M, Usami, K, Komoda, T & Nakamura, H 2014, Design and evaluation of fine-grained power-gating for embedded microprocessors. in Proceedings -Design, Automation and Test in Europe, DATE., 6800359, Institute of Electrical and Electronics Engineers Inc., 17th Design, Automation and Test in Europe, DATE 2014, Dresden, 14/3/24. https://doi.org/10.7873/DATE2014.158
Kondo M, Kobyashi H, Sakamoto R, Wada M, Tsukamoto J, Namiki M et al. Design and evaluation of fine-grained power-gating for embedded microprocessors. In Proceedings -Design, Automation and Test in Europe, DATE. Institute of Electrical and Electronics Engineers Inc. 2014. 6800359 https://doi.org/10.7873/DATE2014.158
Kondo, Masaaki ; Kobyashi, Hiroaki ; Sakamoto, Ryuichi ; Wada, Motoki ; Tsukamoto, Jun ; Namiki, Mitaro ; Wang, Weihan ; Amano, Hideharu ; Matsunaga, Kensaku ; Kudo, Masaru ; Usami, Kimiyoshi ; Komoda, Toshiya ; Nakamura, Hiroshi. / Design and evaluation of fine-grained power-gating for embedded microprocessors. Proceedings -Design, Automation and Test in Europe, DATE. Institute of Electrical and Electronics Engineers Inc., 2014.
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