Development of a double-tilt stage-scanning sample holder for scanning confocal electron microscopy of crystal samples

M. Takeguchi, A. Hashimoto, K. Mitsuishi, X. Zhang, M. Shimojo, T. Ishikawa, S. Deguchi, T. Naruse, Y. Kondo

Research output: Contribution to journalArticle

Original languageEnglish
JournalDefault journal
Publication statusPublished - 2010 Jun 1

Cite this

Development of a double-tilt stage-scanning sample holder for scanning confocal electron microscopy of crystal samples. / Takeguchi, M.; Hashimoto, A.; Mitsuishi, K.; Zhang, X.; Shimojo, M.; Ishikawa, T.; Deguchi, S.; Naruse, T.; Kondo, Y.

In: Default journal, 01.06.2010.

Research output: Contribution to journalArticle

Takeguchi, M, Hashimoto, A, Mitsuishi, K, Zhang, X, Shimojo, M, Ishikawa, T, Deguchi, S, Naruse, T & Kondo, Y 2010, 'Development of a double-tilt stage-scanning sample holder for scanning confocal electron microscopy of crystal samples', Default journal.
Takeguchi, M. ; Hashimoto, A. ; Mitsuishi, K. ; Zhang, X. ; Shimojo, M. ; Ishikawa, T. ; Deguchi, S. ; Naruse, T. ; Kondo, Y. / Development of a double-tilt stage-scanning sample holder for scanning confocal electron microscopy of crystal samples. In: Default journal. 2010.
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AU - Hashimoto, A.

AU - Mitsuishi, K.

AU - Zhang, X.

AU - Shimojo, M.

AU - Ishikawa, T.

AU - Deguchi, S.

AU - Naruse, T.

AU - Kondo, Y.

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