TY - JOUR
T1 - Development of a magnetron sputtering apparatus equipped with superconducting bulk magnets for the preparation of optical multilayer films
AU - Yamaguchi, T.
AU - Ikuta, H.
AU - Yanagi, Y.
AU - Itoh, Y.
AU - Oka, T.
AU - Mizutani, U.
N1 - Funding Information:
We deeply thank Dr. T. Tomofuji, Nikon Co., Ltd., for fruitful discussions and providing valuable information about the synthesis Mo/Si multilayer films and their evaluation methods. We are also grateful to Japan Science and Technology Agency for financial support on the JST project on the application of superconducting magnetron sputtering to the fabrication of Mo/Si multilayer films.
PY - 2007/10/1
Y1 - 2007/10/1
N2 - We have constructed the two-cathode superconducting permanent magnet bearing magnetron sputtering apparatus with the aim at fabricating Mo/Si multilayer films to serve as an optical mirror at extreme ultraviolet wavelength of 10-14 nm. By using the magnetized bulk superconductor, the magnetic field generated immediately above the target can be increased 20 times as strong as that in a conventional magnetron sputtering. This strong magnetic field enables us to perform sputtering in a low gas pressure and with a long throw distance. In the present study, we deposited about 10 nm thick Si and then 10 nm thick Mo layer on the Si wafer and studied the effect of deposition conditions on an interdiffusion layer formed between Si and Mo layers by measuring the grazing incident X-ray reflectivity. As a result, we could successfully reduce the interdiffusion layer thickness down to 0.6 nm, when the deposition was made at the Xe gas pressure of 0.02 Pa, a throw distance of 450 mm and discharge voltage of 2 kV. To the best of our knowledge, this is the lowest thickness of an interdiffusion layer of Mo-Si film ever reported. This promises us to increase the reflectivity towards 70%, when a multilayer film is ready to be synthesized in the present superconducting magnetron sputtering apparatus.
AB - We have constructed the two-cathode superconducting permanent magnet bearing magnetron sputtering apparatus with the aim at fabricating Mo/Si multilayer films to serve as an optical mirror at extreme ultraviolet wavelength of 10-14 nm. By using the magnetized bulk superconductor, the magnetic field generated immediately above the target can be increased 20 times as strong as that in a conventional magnetron sputtering. This strong magnetic field enables us to perform sputtering in a low gas pressure and with a long throw distance. In the present study, we deposited about 10 nm thick Si and then 10 nm thick Mo layer on the Si wafer and studied the effect of deposition conditions on an interdiffusion layer formed between Si and Mo layers by measuring the grazing incident X-ray reflectivity. As a result, we could successfully reduce the interdiffusion layer thickness down to 0.6 nm, when the deposition was made at the Xe gas pressure of 0.02 Pa, a throw distance of 450 mm and discharge voltage of 2 kV. To the best of our knowledge, this is the lowest thickness of an interdiffusion layer of Mo-Si film ever reported. This promises us to increase the reflectivity towards 70%, when a multilayer film is ready to be synthesized in the present superconducting magnetron sputtering apparatus.
KW - EUV lithography
KW - Magnetron sputtering
KW - Mo/Si multilayer
KW - Superconducting bulk magnet
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U2 - 10.1016/j.physc.2007.04.310
DO - 10.1016/j.physc.2007.04.310
M3 - Article
AN - SCOPUS:34548510895
SN - 0921-4534
VL - 463-465
SP - 1342
EP - 1345
JO - Physica C: Superconductivity and its Applications
JF - Physica C: Superconductivity and its Applications
IS - SUPPL.
ER -