Development of annular dark field confocal scanning transmission electron microscopy

M. Takeguchi, A. Hashimoto, K. Mitsuishi, Masayuki Shimojo

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)612-613
Number of pages2
JournalMicroscopy and Microanalysis
Volume15
Issue numberSUPPL. 2
DOIs
Publication statusPublished - 2009 Jul
Externally publishedYes

Fingerprint

Transmission electron microscopy
transmission electron microscopy
Scanning electron microscopy
scanning electron microscopy

ASJC Scopus subject areas

  • Instrumentation

Cite this

Development of annular dark field confocal scanning transmission electron microscopy. / Takeguchi, M.; Hashimoto, A.; Mitsuishi, K.; Shimojo, Masayuki.

In: Microscopy and Microanalysis, Vol. 15, No. SUPPL. 2, 07.2009, p. 612-613.

Research output: Contribution to journalArticle

Takeguchi, M. ; Hashimoto, A. ; Mitsuishi, K. ; Shimojo, Masayuki. / Development of annular dark field confocal scanning transmission electron microscopy. In: Microscopy and Microanalysis. 2009 ; Vol. 15, No. SUPPL. 2. pp. 612-613.
@article{eb6187dc5c8c422d9fab637390c72e7f,
title = "Development of annular dark field confocal scanning transmission electron microscopy",
author = "M. Takeguchi and A. Hashimoto and K. Mitsuishi and Masayuki Shimojo",
year = "2009",
month = "7",
doi = "10.1017/S1431927609093684",
language = "English",
volume = "15",
pages = "612--613",
journal = "Microscopy and Microanalysis",
issn = "1431-9276",
publisher = "Cambridge University Press",
number = "SUPPL. 2",

}

TY - JOUR

T1 - Development of annular dark field confocal scanning transmission electron microscopy

AU - Takeguchi, M.

AU - Hashimoto, A.

AU - Mitsuishi, K.

AU - Shimojo, Masayuki

PY - 2009/7

Y1 - 2009/7

UR - http://www.scopus.com/inward/record.url?scp=69949114579&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=69949114579&partnerID=8YFLogxK

U2 - 10.1017/S1431927609093684

DO - 10.1017/S1431927609093684

M3 - Article

VL - 15

SP - 612

EP - 613

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

SN - 1431-9276

IS - SUPPL. 2

ER -