Different origins of Tc-suppression in YBa2(Cu1-xMx)3Oy(M=Co and Zn)

S. Terada, N. Kobayashi, H. Iwasaki, Ayako Yamamoto, M. Kikuchi, S. Syono, Y. Muto

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

The electrical resistivity, the Hall effect and the oxygen content have been measured for YBa2(Cu1-xMx)3Oy(M = Co and Zn). The electrical resistivity increases with concentration x in both systems. The carrier concentration decreases with x for M = Co, while it remains almost constant for M = Zn. The suppression of Tc in the Co-doped system is explained by the reduction in carrier. In the Zn-doped system, on the other hand, the suppression seems to be caused by the electron localization in Cu-O planes.

Original languageEnglish
Pages (from-to)1545-1546
Number of pages2
JournalPhysica B: Condensed Matter
Volume165-66
Issue number2
Publication statusPublished - 1990 Aug
Externally publishedYes

Fingerprint

Hall effect
Carrier concentration
retarding
Oxygen
electrical resistivity
Electrons
oxygen
electrons

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Cite this

Terada, S., Kobayashi, N., Iwasaki, H., Yamamoto, A., Kikuchi, M., Syono, S., & Muto, Y. (1990). Different origins of Tc-suppression in YBa2(Cu1-xMx)3Oy(M=Co and Zn). Physica B: Condensed Matter, 165-66(2), 1545-1546.

Different origins of Tc-suppression in YBa2(Cu1-xMx)3Oy(M=Co and Zn). / Terada, S.; Kobayashi, N.; Iwasaki, H.; Yamamoto, Ayako; Kikuchi, M.; Syono, S.; Muto, Y.

In: Physica B: Condensed Matter, Vol. 165-66, No. 2, 08.1990, p. 1545-1546.

Research output: Contribution to journalArticle

Terada, S, Kobayashi, N, Iwasaki, H, Yamamoto, A, Kikuchi, M, Syono, S & Muto, Y 1990, 'Different origins of Tc-suppression in YBa2(Cu1-xMx)3Oy(M=Co and Zn)', Physica B: Condensed Matter, vol. 165-66, no. 2, pp. 1545-1546.
Terada S, Kobayashi N, Iwasaki H, Yamamoto A, Kikuchi M, Syono S et al. Different origins of Tc-suppression in YBa2(Cu1-xMx)3Oy(M=Co and Zn). Physica B: Condensed Matter. 1990 Aug;165-66(2):1545-1546.
Terada, S. ; Kobayashi, N. ; Iwasaki, H. ; Yamamoto, Ayako ; Kikuchi, M. ; Syono, S. ; Muto, Y. / Different origins of Tc-suppression in YBa2(Cu1-xMx)3Oy(M=Co and Zn). In: Physica B: Condensed Matter. 1990 ; Vol. 165-66, No. 2. pp. 1545-1546.
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AU - Kikuchi, M.

AU - Syono, S.

AU - Muto, Y.

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AB - The electrical resistivity, the Hall effect and the oxygen content have been measured for YBa2(Cu1-xMx)3Oy(M = Co and Zn). The electrical resistivity increases with concentration x in both systems. The carrier concentration decreases with x for M = Co, while it remains almost constant for M = Zn. The suppression of Tc in the Co-doped system is explained by the reduction in carrier. In the Zn-doped system, on the other hand, the suppression seems to be caused by the electron localization in Cu-O planes.

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